In this paper, a novel procedure of simultaneous measurement of the ultrathin film volumetric density and the Young׳s modulus utilizing the Monte Carlo probabilistic method combined with the finite-element method (FEM) and the experiments carried out on the suspended micro-/nanomechanical resonator with a deposited thin film under different but controllable axial prestresses is proposed and analyzed. Since the procedure requires detection of only two bending fundamental resonant frequencies of a beam under different axial prestress forces, the impacts of noise and damping on accuracy of the results are minimized and thus it essentially improves its reliability. Then the volumetric mass density and the Young׳s modulus of thin film are evalua...
Abstract: One challenge in designing micro-electro-mechanical systems (MEMS) is conside-ring the var...
Predictive design of MEMS devices and their performance evaluation require post-fabrication measurem...
<div><p>The companies that manufacture devices with techniques inherited from microelectronics, call...
By measuring the resonant frequencies of cantilever beams without and with thinfilms deposited and w...
Based on the first resonance frequency measurement of multilayer beams, a simple extraction method h...
Measurement of ultrathin film thickness and its basic properties can be highly challenging and time ...
As microelectromechanical systems (MEMS) become more complex and is produced in even greater numbers...
Among the various mechanical properties of materials used in the manufacturing of micro/nano devices...
As microelectromechnical systems (MEMS) becomes more complex and are produced in even greater numbe...
[[abstract]]The elastic modulus is a very important mechanical property in micromachined structures....
This paper presents a technique to determine the Young’s modulus and residual stress of thin films u...
Nanoscale materials have properties that frequently differ from those of their bulk form due to the ...
This paper presents a technique to determine the Young’s modulus and residual stress of thin films u...
A point-force, load-deflection method using a stylus-type surface profiler to determine the Young&ap...
The use of micro-cantilever test structures for determining the density of thin film materials is re...
Abstract: One challenge in designing micro-electro-mechanical systems (MEMS) is conside-ring the var...
Predictive design of MEMS devices and their performance evaluation require post-fabrication measurem...
<div><p>The companies that manufacture devices with techniques inherited from microelectronics, call...
By measuring the resonant frequencies of cantilever beams without and with thinfilms deposited and w...
Based on the first resonance frequency measurement of multilayer beams, a simple extraction method h...
Measurement of ultrathin film thickness and its basic properties can be highly challenging and time ...
As microelectromechanical systems (MEMS) become more complex and is produced in even greater numbers...
Among the various mechanical properties of materials used in the manufacturing of micro/nano devices...
As microelectromechnical systems (MEMS) becomes more complex and are produced in even greater numbe...
[[abstract]]The elastic modulus is a very important mechanical property in micromachined structures....
This paper presents a technique to determine the Young’s modulus and residual stress of thin films u...
Nanoscale materials have properties that frequently differ from those of their bulk form due to the ...
This paper presents a technique to determine the Young’s modulus and residual stress of thin films u...
A point-force, load-deflection method using a stylus-type surface profiler to determine the Young&ap...
The use of micro-cantilever test structures for determining the density of thin film materials is re...
Abstract: One challenge in designing micro-electro-mechanical systems (MEMS) is conside-ring the var...
Predictive design of MEMS devices and their performance evaluation require post-fabrication measurem...
<div><p>The companies that manufacture devices with techniques inherited from microelectronics, call...