Add to ORKGThe measured and calculated values of t he Flip Flop parameters needed to specify synchronizer reliability are presented for 3 different depletion-load, silicon gate, NMOS, R-S Flip Flop circuits with gate lengths ranging from 6μm to 4.2μm. Estimates of the probability of synchronizer failure to resolve within allowed or desired times can be determined from these parameters
variability in process parameters, such as the threshold voltage, are expected to increase and becom...
International audienceWith the event of nanoscale technologies, new physical phenomena and technolog...
PhD ThesisParametric variability increasingly affects the performance of electronic circuits as t...
The effect of nondeterministic resolution times of flip-flops, used for synchronizing externally gen...
Technology scaling has paved way for complex systems such as heterogeneous multi core processors, co...
Computing systems are now frequently composed of independently clocked subsystems that cooperate to ...
Synchronizers are used at the clock domain crossings and at asynchronous interfaces to reduce the pr...
Designing synchronous sequential circuits consisting of clocked storage elements such as flip-flops ...
In this paper, we use circuit simulations to characterize the effects of technology scaling on the m...
The effect of aging has become an important reliability concern in Silicon MOSFET technology today. ...
Abstract- Synchronizers were required when reading an asynchronous input. In a multi clock system, s...
In 2007, Yang and Greenstreet presented an algorithm that enables the computation of synchronizer f...
Accurate timing characterization of flip-flops is critical for robust circuit design. Conventionally...
Graduation date: 1983The problem of synchronization arises in the interaction among\ud digital syste...
In this study, the authors present a design optimisation case study of D-type flip-flop timing chara...
variability in process parameters, such as the threshold voltage, are expected to increase and becom...
International audienceWith the event of nanoscale technologies, new physical phenomena and technolog...
PhD ThesisParametric variability increasingly affects the performance of electronic circuits as t...
The effect of nondeterministic resolution times of flip-flops, used for synchronizing externally gen...
Technology scaling has paved way for complex systems such as heterogeneous multi core processors, co...
Computing systems are now frequently composed of independently clocked subsystems that cooperate to ...
Synchronizers are used at the clock domain crossings and at asynchronous interfaces to reduce the pr...
Designing synchronous sequential circuits consisting of clocked storage elements such as flip-flops ...
In this paper, we use circuit simulations to characterize the effects of technology scaling on the m...
The effect of aging has become an important reliability concern in Silicon MOSFET technology today. ...
Abstract- Synchronizers were required when reading an asynchronous input. In a multi clock system, s...
In 2007, Yang and Greenstreet presented an algorithm that enables the computation of synchronizer f...
Accurate timing characterization of flip-flops is critical for robust circuit design. Conventionally...
Graduation date: 1983The problem of synchronization arises in the interaction among\ud digital syste...
In this study, the authors present a design optimisation case study of D-type flip-flop timing chara...
variability in process parameters, such as the threshold voltage, are expected to increase and becom...
International audienceWith the event of nanoscale technologies, new physical phenomena and technolog...
PhD ThesisParametric variability increasingly affects the performance of electronic circuits as t...