Characterisation of FeBSiC coated MFM tips using Lorentz electron tomography and MFM
- Scott, J.
- McVitie, S.
- Ferrier, R.P.
- Heydon, G.P.
- Rainforth, W.M.
- Gibbs, M.R.J.
- Tucker, J.W.
- Davies, H.A.
- Bishop, J.E.L.
Publication date
September 1999
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE) ISSN
0018-9464 Citation count (estimate)
4Abstract
Magnetic force microscope (MFM) tips coated with an amorphous ferromagnetic alloy have been studied using MFM and Lorentz electron microscopy. Imaging a standard NIST hard disk sample in the MFM reveals that the character of the tips varies dramatically with film thickness. The stray field distributions of the tips were determined using Lorentz electron tomography, and were found to be consistent with the contrast observed by MFM
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