A method of detecting faults for evaluating the fault cross section of any field programmable gate array (FPGA) was developed and is described in the thesis. The incidence of single event effects in FPGAs was studied for different probe particles (proton, neutron, gamma) using this method. The existing accelerator infrastructure of the Nuclear Physics Institute in Rez was supplemented by more sensitive beam monitoring system to ensure that the tests are done under well defined beam conditions. The bit cross section of single event effects was measured for different types of configuration memories, clock signal phase and beam energies and intensities. The extended infrastructure served also for radiation testing of components which are plan...
Errors within circuits caused by radiation continue to be an important concern to developers. A new ...
This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 fi...
In recent years, field-programmable gate array (FPGA) devices have attracted a lot of attentions due...
This thesis describes a technology and methodology designed anddeveloped for the study of certain as...
This paper describes how fault injection has been implemented as a test method for an FPGA in an exi...
Single Event Upsets in SRAM FPGA based readout electronics for the Time Projection Chamber in the AL...
This paper presents an approach to detect SEEs in SRAM-based FPGAs by using software-based technique...
Field programmable gate arrays (FPGAs) are getting more attention in safety-related and safety-criti...
Traditionally, heavy ion radiation effects affecting digital systems working in safety critical appl...
Analysis of single event transients (SETs) generated in field programmable gate arrays (FPGA) under ...
ISBN :978-1-4419-6922-7Integrated circuits (analog, digital or mixed) sensitivity evaluation to Sing...
Soft errors induced by radiation are the major reliability threat for SRAM-based field-programmable ...
FPGAs are attractive devices as they enable the designer to make changes to the system during its li...
The constantly increasing memory density and performance of recent Field Programmable Gate Arrays (F...
Over the years 2019-2020, the ALICE experimental apparatus will undergo a major upgrade. A key eleme...
Errors within circuits caused by radiation continue to be an important concern to developers. A new ...
This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 fi...
In recent years, field-programmable gate array (FPGA) devices have attracted a lot of attentions due...
This thesis describes a technology and methodology designed anddeveloped for the study of certain as...
This paper describes how fault injection has been implemented as a test method for an FPGA in an exi...
Single Event Upsets in SRAM FPGA based readout electronics for the Time Projection Chamber in the AL...
This paper presents an approach to detect SEEs in SRAM-based FPGAs by using software-based technique...
Field programmable gate arrays (FPGAs) are getting more attention in safety-related and safety-criti...
Traditionally, heavy ion radiation effects affecting digital systems working in safety critical appl...
Analysis of single event transients (SETs) generated in field programmable gate arrays (FPGA) under ...
ISBN :978-1-4419-6922-7Integrated circuits (analog, digital or mixed) sensitivity evaluation to Sing...
Soft errors induced by radiation are the major reliability threat for SRAM-based field-programmable ...
FPGAs are attractive devices as they enable the designer to make changes to the system during its li...
The constantly increasing memory density and performance of recent Field Programmable Gate Arrays (F...
Over the years 2019-2020, the ALICE experimental apparatus will undergo a major upgrade. A key eleme...
Errors within circuits caused by radiation continue to be an important concern to developers. A new ...
This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 fi...
In recent years, field-programmable gate array (FPGA) devices have attracted a lot of attentions due...