A Methodology for the Analysis of Memory Response to Radiation through Bitmap Superposition and Slicing
- Bosser, A.
- Gupta, V.
- Tsiligiannis, G.
- Ferraro, R.
- Frost, C.
- Javanainen, A.
- Puchner, H.
- Rossi, M.
- Saigne, F.
- Virtanen, A.
- Wrobel, F.
- Zadeh, A.
- Dilillo, L.
Publication date
January 2015
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
A methodology is proposed for the statistical analysis of memory radiation test data, with the aim of identifying trends in the single-even upset (SEU) distribution. The treated case study is a 65nm SRAM irradiated with neutrons, protons and heavy-ions
Add to ORKG