This book deals with standard spectroscopic techniques which can be used to analyze semiconductor samples or devices, in both, bulk, micrometer and submicrometer scale. The book aims helping experimental physicists and engineers to choose the right analytical spectroscopic technique in order to get specific information about their specific demands. For this purpose, the techniques including technical details such as apparatus and probed sample region are described. More important, also the expected outcome from experiments is provided. This involves also the link to theory, that is not subject of this book, and the link to current experimental results in the literature which are presented in a review-like style. Many special spectroscopic t...
This up-to-date reference for students and researchers in the field is the first systematic treatmen...
This paper is an attempt to introduce the spectroscopic measurement techniques in simple form. It c...
ABSTRACT Optical spectroscopy is a non-destructive and contactless method for characterizing optical...
Producción CientíficaThis book deals with standard spectroscopic techniques which can be used to ana...
A la suite d'une brève récapitulation des nombreuses techniques optiques significatives et de leurs ...
RCumB.- A la suite d'une brke recapitulation des nombreuses techniques optiques signifi-cative ...
The book describes the fundamentals, latest developments and use of key experimental techniques for ...
This revised and updated edition of the well-received book by C. Klingshirn provides an introduction...
Photoluminescence spectroscopy is an important approach for examining the optical interactions in se...
Spectroscopic techniques are necessary for the characterization of optoelectronic materials. Among ...
Based on a series of lectures at Berkeley, 1968-1969, this is the first book to deal comprehensively...
This book describes the key theoretical techniques for semiconductor research to quantitatively calc...
Modern spectroscopic techniques have a number of applications in many fields including material scie...
This updated and enlarged new edition of Semiconductor Optics provides an introduction to and an ove...
Restricting the problem of the physico-chemical characterization of a semiconductor to the main topi...
This up-to-date reference for students and researchers in the field is the first systematic treatmen...
This paper is an attempt to introduce the spectroscopic measurement techniques in simple form. It c...
ABSTRACT Optical spectroscopy is a non-destructive and contactless method for characterizing optical...
Producción CientíficaThis book deals with standard spectroscopic techniques which can be used to ana...
A la suite d'une brève récapitulation des nombreuses techniques optiques significatives et de leurs ...
RCumB.- A la suite d'une brke recapitulation des nombreuses techniques optiques signifi-cative ...
The book describes the fundamentals, latest developments and use of key experimental techniques for ...
This revised and updated edition of the well-received book by C. Klingshirn provides an introduction...
Photoluminescence spectroscopy is an important approach for examining the optical interactions in se...
Spectroscopic techniques are necessary for the characterization of optoelectronic materials. Among ...
Based on a series of lectures at Berkeley, 1968-1969, this is the first book to deal comprehensively...
This book describes the key theoretical techniques for semiconductor research to quantitatively calc...
Modern spectroscopic techniques have a number of applications in many fields including material scie...
This updated and enlarged new edition of Semiconductor Optics provides an introduction to and an ove...
Restricting the problem of the physico-chemical characterization of a semiconductor to the main topi...
This up-to-date reference for students and researchers in the field is the first systematic treatmen...
This paper is an attempt to introduce the spectroscopic measurement techniques in simple form. It c...
ABSTRACT Optical spectroscopy is a non-destructive and contactless method for characterizing optical...