Sub-LET Threshold SEE cross section dependency with ion energy
- Garcia Alia, Ruben
- Bahamonde, C.
- Brandenburg, Sijtze
- Brugger, Markus
- Daly, E.
- Ferlet-Cavrois, Veronique
- Gaillard, R.
- Hoeffgen, S.
- Menicucci, A.
- Metzger, S.
- Zadeh, A.
- Muschitiello, M.
- Noordeh, A.
- Santin, G.
Publication date
January 2015
DOI Publisher
Institute of Electrical and Electronics Engineers (IEEE)Abstract
This study focuses on the ion species and energy dependence of the heavy ion SEE cross section in the sub-LET threshold region through a set of experimental data. In addition, a Monte Carlo based model is introduced and applied, showing a good agreement with the data in the several hundred MeV/n range while evidencing large discrepancies with the measurements in the 10-30 MeV/n interval, notably for the Ne ion. Such discrepancies are carefully analyzed and discussed
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