We report the design of a mobile setup for synchrotron based in situ studies during atomic layer processing. The system was designed to facilitate in situ grazing incidence small angle x-ray scattering (GISAXS), x-ray fluorescence (XRF), and x-ray absorption spectroscopy measurements at synchrotron facilities. The setup consists of a compact high vacuum pump-type reactor for atomic layer deposition (ALD). The presence of a remote radio frequency plasma source enables in situ experiments during both thermal as well as plasma-enhanced ALD. The system has been successfully installed at different beam line end stations at the European Synchrotron Radiation Facility and SOLEIL synchrotrons. Examples are discussed of in situ GISAXS and XRF measur...
Paper presented at 11th International Conference on Synchrotron Radiation Instrumentation (SRI 2012)...
In this paper, we present an x-ray based approach for in situ characterization during ALD processes....
In this paper, we present an x-ray based approach for in situ characterization during ALD processes....
We report the design of a mobile setup for synchrotron based in situ studies during atomic layer pro...
We report the design of a mobile setup for synchrotron based in situ studies during atomic layer pro...
We report the design of a mobile setup for synchrotron based in situ studies during atomic layer pro...
We report the design of a mobile setup for synchrotron based in situ studies during atomic layer pro...
Synchrotron based x-ray fluorescence (XRF) and grazing incidence small angle scattering (GISAXS) are...
Synchrotron based x-ray fluorescence (XRF) and grazing incidence small angle scattering (GISAXS) are...
An ambient pressure cell is described for conducting synchrotron-based x-ray photoelectron spectrosc...
Abstract An ambient pressure cell is described for conducting synchrotron-based x-ray photoelectron...
An ambient pressure cell is described for conducting synchrotron-based x-ray photoelectron spectrosc...
An ambient pressure cell is described for conducting synchrotron-based x-ray photoelectron spectrosc...
An ambient pressure cell is described for conducting synchrotron-based x-ray photoelectron spectrosc...
Funding Information: The ALD cell is a result of collaboration between the University of Helsinki (F...
Paper presented at 11th International Conference on Synchrotron Radiation Instrumentation (SRI 2012)...
In this paper, we present an x-ray based approach for in situ characterization during ALD processes....
In this paper, we present an x-ray based approach for in situ characterization during ALD processes....
We report the design of a mobile setup for synchrotron based in situ studies during atomic layer pro...
We report the design of a mobile setup for synchrotron based in situ studies during atomic layer pro...
We report the design of a mobile setup for synchrotron based in situ studies during atomic layer pro...
We report the design of a mobile setup for synchrotron based in situ studies during atomic layer pro...
Synchrotron based x-ray fluorescence (XRF) and grazing incidence small angle scattering (GISAXS) are...
Synchrotron based x-ray fluorescence (XRF) and grazing incidence small angle scattering (GISAXS) are...
An ambient pressure cell is described for conducting synchrotron-based x-ray photoelectron spectrosc...
Abstract An ambient pressure cell is described for conducting synchrotron-based x-ray photoelectron...
An ambient pressure cell is described for conducting synchrotron-based x-ray photoelectron spectrosc...
An ambient pressure cell is described for conducting synchrotron-based x-ray photoelectron spectrosc...
An ambient pressure cell is described for conducting synchrotron-based x-ray photoelectron spectrosc...
Funding Information: The ALD cell is a result of collaboration between the University of Helsinki (F...
Paper presented at 11th International Conference on Synchrotron Radiation Instrumentation (SRI 2012)...
In this paper, we present an x-ray based approach for in situ characterization during ALD processes....
In this paper, we present an x-ray based approach for in situ characterization during ALD processes....