We describe two process steps in an STM-based fabrication technology for nanoelectronic devices. First, we have fabricated Co/Si metal lines on Si(100) surfaces by UHV-STM based nanolithography on a monohydride passivation layer. The STM tip was used to define depassivated lines
A nanoscale fabrication process compatible with present Si technology is reported. Preimplanted cont...
81 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.The scanning tunneling microsc...
81 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.The scanning tunneling microsc...
We describe two process steps in an STM-based fabrication technology for nanoelectronic devices. Fir...
We describe two process steps in an STM-based fabrication technology for nanoelectronic devices. Fir...
We describe two process steps in an STM-based fabrication technology for nanoelectronic devices. Fir...
We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...
We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...
We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...
We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...
We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...
We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...
We present a complete fabrication process for the creation of robust nano-and atomic-scale devices i...
Nanoscale patterning of the Si(100)-2x1:H monohydride surface has been achieved using an ultrahigh v...
We present the development of a novel, UHV-compatible device fabrication strategy for the realisatio...
A nanoscale fabrication process compatible with present Si technology is reported. Preimplanted cont...
81 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.The scanning tunneling microsc...
81 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.The scanning tunneling microsc...
We describe two process steps in an STM-based fabrication technology for nanoelectronic devices. Fir...
We describe two process steps in an STM-based fabrication technology for nanoelectronic devices. Fir...
We describe two process steps in an STM-based fabrication technology for nanoelectronic devices. Fir...
We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...
We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...
We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...
We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...
We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...
We have fabricated nanometer width Co/Si metal lines on Si(100) surfaces by ultrahigh-vacuum scannin...
We present a complete fabrication process for the creation of robust nano-and atomic-scale devices i...
Nanoscale patterning of the Si(100)-2x1:H monohydride surface has been achieved using an ultrahigh v...
We present the development of a novel, UHV-compatible device fabrication strategy for the realisatio...
A nanoscale fabrication process compatible with present Si technology is reported. Preimplanted cont...
81 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.The scanning tunneling microsc...
81 p.Thesis (Ph.D.)--University of Illinois at Urbana-Champaign, 1998.The scanning tunneling microsc...