The distribution of the scattering intensity in the reciprocal space for natural and artificial opals has been reconstructed from a set of small-angle X-ray diffraction patterns. The resulting three-dimensional intensity maps are used to analyze the defect structure of opals. The structure of artificial opals can be satisfactorily described in the Wilson probability model with the prevalence of layers in the fcc environment. The diffraction patterns observed for a natural opal confirm the presence of sufficiently long unequally occupied fcc domains
A new classification of opals through X-ray powder diffraction (XRPD) methodology, by analysing 75 n...
Il lavoro contiene una formulazione teorica che permette di calcolare le proprietà ottiche di crista...
Bulk polystyrene opals have been grown. Variable incidence angle reflectance spectroscopy is used to...
Conclusions To summarize, in this chapter diffraction of light and x-rays on opal-like structures is...
The results of an ultrasmall angle X ray scattering study of iron(III) oxide inverse opal thin films...
Small angle X ray diffraction from synthetic opal films has been investigated as a function of the o...
Three-dimensional artificial opals showing photonic crystals properties are grown by self-assembly o...
The structure of inverse opal crystals based on nickel was probed on the mesoscopic and atomic level...
A theoretical approach for the interpretation of reflectance spectra of opal photonic crystals with ...
We present the results of the structural analysis of inverse opal photonic crystals by microradian X...
Three-dimensional artificial opals showing photonic crystals properties are grown by self-assembly o...
We present the results of the structural analysis of inverse opal photonic crystals by microradian X...
Artificial opal films have been prepared by sedimentation of monodisperse silica spheres in water su...
Artificial opal films have been prepared by sedimentation of monodisperse silica spheres in water su...
Bulk polystyrene opals have been grown. Variable incidence angle reflectance spectroscopy is used to...
A new classification of opals through X-ray powder diffraction (XRPD) methodology, by analysing 75 n...
Il lavoro contiene una formulazione teorica che permette di calcolare le proprietà ottiche di crista...
Bulk polystyrene opals have been grown. Variable incidence angle reflectance spectroscopy is used to...
Conclusions To summarize, in this chapter diffraction of light and x-rays on opal-like structures is...
The results of an ultrasmall angle X ray scattering study of iron(III) oxide inverse opal thin films...
Small angle X ray diffraction from synthetic opal films has been investigated as a function of the o...
Three-dimensional artificial opals showing photonic crystals properties are grown by self-assembly o...
The structure of inverse opal crystals based on nickel was probed on the mesoscopic and atomic level...
A theoretical approach for the interpretation of reflectance spectra of opal photonic crystals with ...
We present the results of the structural analysis of inverse opal photonic crystals by microradian X...
Three-dimensional artificial opals showing photonic crystals properties are grown by self-assembly o...
We present the results of the structural analysis of inverse opal photonic crystals by microradian X...
Artificial opal films have been prepared by sedimentation of monodisperse silica spheres in water su...
Artificial opal films have been prepared by sedimentation of monodisperse silica spheres in water su...
Bulk polystyrene opals have been grown. Variable incidence angle reflectance spectroscopy is used to...
A new classification of opals through X-ray powder diffraction (XRPD) methodology, by analysing 75 n...
Il lavoro contiene una formulazione teorica che permette di calcolare le proprietà ottiche di crista...
Bulk polystyrene opals have been grown. Variable incidence angle reflectance spectroscopy is used to...