The response of the ellipsometric parameters as a function of wavelength has been derived for an optical retarder. Experimental results in the wavelength region 400–1000 nm are given, these are in agreement with the derived formalism
Ellipsometry is an optical method based on the study of the behavior of polarized light. The light r...
Deep lamellar diffraction gratings fabricated by etching a transparent quartz plate are studied usin...
The knowledge and the manipulation of light polarization state in the vacuum ultraviolet and extreme...
The response ofthe ellipsometric parameters as a function of wavelength has been derived for an opti...
Rotating compensator ellipsometry (RCE) is an approach to ellipsometry that is superior to the widel...
The index of refraction is a material property that determines the speed of light propagating throug...
Ellipsometry have been widely used in thin film characterization. It has proven to be an extremely p...
[[abstract]]Coating technology has played an important role in optics, opto-electronics, semiconduct...
Spectroscopic ellipsometry has long been recognized as the technique ofchoice to characterize thin f...
Ellipsometry is a powerful technique for the determination of complex refractive indices n=n+ik of t...
Measurements of optical properties provide insight into how materials interact with electromagnetic ...
Ellipsometry is an optical method used for characterizing materials and thin films. The principle is...
We report on a polarizing interferometer ellipsometer arrangement that overcomes the need for additi...
<p>Refractive index of the photo-reactive PEG determined by spectroscopic ellipsometry.</p
A retroreflection (return-path) spectroscopic ellipsometer without a wave plate is described that us...
Ellipsometry is an optical method based on the study of the behavior of polarized light. The light r...
Deep lamellar diffraction gratings fabricated by etching a transparent quartz plate are studied usin...
The knowledge and the manipulation of light polarization state in the vacuum ultraviolet and extreme...
The response ofthe ellipsometric parameters as a function of wavelength has been derived for an opti...
Rotating compensator ellipsometry (RCE) is an approach to ellipsometry that is superior to the widel...
The index of refraction is a material property that determines the speed of light propagating throug...
Ellipsometry have been widely used in thin film characterization. It has proven to be an extremely p...
[[abstract]]Coating technology has played an important role in optics, opto-electronics, semiconduct...
Spectroscopic ellipsometry has long been recognized as the technique ofchoice to characterize thin f...
Ellipsometry is a powerful technique for the determination of complex refractive indices n=n+ik of t...
Measurements of optical properties provide insight into how materials interact with electromagnetic ...
Ellipsometry is an optical method used for characterizing materials and thin films. The principle is...
We report on a polarizing interferometer ellipsometer arrangement that overcomes the need for additi...
<p>Refractive index of the photo-reactive PEG determined by spectroscopic ellipsometry.</p
A retroreflection (return-path) spectroscopic ellipsometer without a wave plate is described that us...
Ellipsometry is an optical method based on the study of the behavior of polarized light. The light r...
Deep lamellar diffraction gratings fabricated by etching a transparent quartz plate are studied usin...
The knowledge and the manipulation of light polarization state in the vacuum ultraviolet and extreme...
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