In this paper, we calculate MFM signals for tips with various tip-end shapes and discuss the effect of tip sharpening of MFM sensitivity and resolution
The structure of the atomic arrangement at the apex of the tip plays an important role in the atomic...
This project designed AFM probe tips to minimise errors, along with methods of micromachining them.M...
Magnetic force microscope (MFM) tips are prepared by coating Si tips of 4 nm radius with L10 ordered...
The transfer functions of tips with various sharpened tip ends were calculated and the resolution of...
The magnetic force microscope (MFM) is an established experimental tool for imaging stray fields wit...
The AFM image will be distorted due to the tip-broadening effect. It may be mathematically represent...
In this chapter Magnetic Force Microscopy is treated in detail. The emphasis is on high resolution a...
AFM image is often distorted due to the influence of the tip shape. This problem has become one of t...
Starting from the tip transfer function (TTF), as derived in [1], a minimum detectable wavelength wi...
We present the development of a probe for scanning probe microscopy and recording, called the CantiC...
Starting from the tip transfer function (TTF), as derived in [1], a minimum detectable wavelength wi...
AFM image is often distorted due to the influence of the tip shape. This problem has become one of t...
A magnetically coated tip is a fundamental part of the MFM instrument. These tips’ are bought commer...
Abstract. In this chapter Magnetic Force Microscopy is treated in detail. The emphasis is on high re...
Switching magnetization magnetic force microscopy (SM-MFM) is based on two-pass magnetic force mi-cr...
The structure of the atomic arrangement at the apex of the tip plays an important role in the atomic...
This project designed AFM probe tips to minimise errors, along with methods of micromachining them.M...
Magnetic force microscope (MFM) tips are prepared by coating Si tips of 4 nm radius with L10 ordered...
The transfer functions of tips with various sharpened tip ends were calculated and the resolution of...
The magnetic force microscope (MFM) is an established experimental tool for imaging stray fields wit...
The AFM image will be distorted due to the tip-broadening effect. It may be mathematically represent...
In this chapter Magnetic Force Microscopy is treated in detail. The emphasis is on high resolution a...
AFM image is often distorted due to the influence of the tip shape. This problem has become one of t...
Starting from the tip transfer function (TTF), as derived in [1], a minimum detectable wavelength wi...
We present the development of a probe for scanning probe microscopy and recording, called the CantiC...
Starting from the tip transfer function (TTF), as derived in [1], a minimum detectable wavelength wi...
AFM image is often distorted due to the influence of the tip shape. This problem has become one of t...
A magnetically coated tip is a fundamental part of the MFM instrument. These tips’ are bought commer...
Abstract. In this chapter Magnetic Force Microscopy is treated in detail. The emphasis is on high re...
Switching magnetization magnetic force microscopy (SM-MFM) is based on two-pass magnetic force mi-cr...
The structure of the atomic arrangement at the apex of the tip plays an important role in the atomic...
This project designed AFM probe tips to minimise errors, along with methods of micromachining them.M...
Magnetic force microscope (MFM) tips are prepared by coating Si tips of 4 nm radius with L10 ordered...
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