The topic of this thesis is about soft-errors in digital systems. Different aspects of soft-errors have been addressed here, including an accurate simulation model to emulate soft-errors in a gate-level net list, a simulation framework to study the impact of soft-errors in a VHDL design and an efficient architecture to minimize the impact of soft-errors in a DSP processor. The first two chapters of this thesis introduce the basic knowledge with regard to soft-errors. Chapter three introduces a simulation framework to study the impact of soft-errors in complex digital systems modelled in VHDL language. This framework has been introduced to resolve the enormous CPU time typically required in simulation-based soft-error experiments. Chapter fo...
International audienceThis chapter surveys soft errors induced by natural radiation on advanced comp...
This paper proposes the use of metrics to refine system design for soft errors protection in system ...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
The topic of this thesis is about soft-errors in digital systems. Different aspects of soft-errors h...
This thesis deals primarily with the problem of soft-error tolerance in digital machines. The possib...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
Soft-errors have become a major reliability threat in advanced CMOS technologies. In this talk we pr...
International audienceThis paper presents a new methodology for the simulation of soft errors in dig...
This paper presents two soft-error mitigation methods for DSP processors. Considering that a DSP pro...
Frontiers in Electronic Testing, Vol. 41, 1st Edition., XVIIISoft Errors in Modern Electronic System...
This paper presents two soft-error mitigation methods for DSP processors. Considering that a DSP pro...
This thesis investigates techniques for making closed loop control systems fault-tolerant and robust...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
International audienceThis chapter surveys soft errors induced by natural radiation on advanced comp...
International audienceThis chapter surveys soft errors induced by natural radiation on advanced comp...
This paper proposes the use of metrics to refine system design for soft errors protection in system ...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
The topic of this thesis is about soft-errors in digital systems. Different aspects of soft-errors h...
This thesis deals primarily with the problem of soft-error tolerance in digital machines. The possib...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
Soft-errors have become a major reliability threat in advanced CMOS technologies. In this talk we pr...
International audienceThis paper presents a new methodology for the simulation of soft errors in dig...
This paper presents two soft-error mitigation methods for DSP processors. Considering that a DSP pro...
Frontiers in Electronic Testing, Vol. 41, 1st Edition., XVIIISoft Errors in Modern Electronic System...
This paper presents two soft-error mitigation methods for DSP processors. Considering that a DSP pro...
This thesis investigates techniques for making closed loop control systems fault-tolerant and robust...
Technology and voltage scaling is making integrated circuits increasingly susceptible to failures ca...
International audienceThis chapter surveys soft errors induced by natural radiation on advanced comp...
International audienceThis chapter surveys soft errors induced by natural radiation on advanced comp...
This paper proposes the use of metrics to refine system design for soft errors protection in system ...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...