In avionics, like glide computers, the problem of No Faults Found (NFF) is a very serious and extremely costly affair. The rare occurrences and short bursts of these faults are the most difficult ones to detect and diagnose in the testing arena. Several techniques are now being developed in ICs by us to cope with one particular category of NFFs, being intermittent resistive faults (IRF). The reuse of these (on-chip) embedded instruments for detection of these faults at the board-level is being investigated in conjunction with the possibilities of enhancing the (mixed-signal) boundary-scan standard IEEE 1149.4. This paper will explore how this can be accomplished
The most difficult fault category in electronic systems is the “No Fault Found‿ (NFF). It is conside...
Diagnosis of actuator faults is crucial for aircraft since loss of actuation can have catastrophic c...
The complexity of integrated circuit (IC) designs continues to increase with the constant advancemen...
No fault found (NFF) is a major threat in extremely dependable high-end process node integrated syst...
Interconnection reliability issues threat the dependability of highly dependable systems. One of the...
The required dependability of integrated CMOS systems has to be continuously increased because nowad...
A major threat in extremely dependable high-end process node integrated systems in e.g. Avionics are...
Interconnection reliability threats dependability of highly critical electronic systems. One of most...
Abstract: Intermittent faults are completely missed out by traditional monitoring and detection tech...
There are various occurrences and root causes that result in no-fault-found (NFF) events but an inte...
The IEEE 1149.1 standard (boundary-scan) was originally developed as a technology to provide in-cir...
Literature survey and correspondence with industrial sector shows that No-Fault-Found (NFF) is a maj...
Conference of 13th IEEE SENSORS Conference, SENSORS 2014 ; Conference Date: 2 November 2014 Through ...
Boundary value testing is a widely used functional test-ing approach. This paper presents a new boun...
With the advent of VLSI technology, the systems fabricated in deep sub micron technology are more pr...
The most difficult fault category in electronic systems is the “No Fault Found‿ (NFF). It is conside...
Diagnosis of actuator faults is crucial for aircraft since loss of actuation can have catastrophic c...
The complexity of integrated circuit (IC) designs continues to increase with the constant advancemen...
No fault found (NFF) is a major threat in extremely dependable high-end process node integrated syst...
Interconnection reliability issues threat the dependability of highly dependable systems. One of the...
The required dependability of integrated CMOS systems has to be continuously increased because nowad...
A major threat in extremely dependable high-end process node integrated systems in e.g. Avionics are...
Interconnection reliability threats dependability of highly critical electronic systems. One of most...
Abstract: Intermittent faults are completely missed out by traditional monitoring and detection tech...
There are various occurrences and root causes that result in no-fault-found (NFF) events but an inte...
The IEEE 1149.1 standard (boundary-scan) was originally developed as a technology to provide in-cir...
Literature survey and correspondence with industrial sector shows that No-Fault-Found (NFF) is a maj...
Conference of 13th IEEE SENSORS Conference, SENSORS 2014 ; Conference Date: 2 November 2014 Through ...
Boundary value testing is a widely used functional test-ing approach. This paper presents a new boun...
With the advent of VLSI technology, the systems fabricated in deep sub micron technology are more pr...
The most difficult fault category in electronic systems is the “No Fault Found‿ (NFF). It is conside...
Diagnosis of actuator faults is crucial for aircraft since loss of actuation can have catastrophic c...
The complexity of integrated circuit (IC) designs continues to increase with the constant advancemen...