The most difficult fault category in electronic systems is the “No Fault Found‿ (NFF). It is considered to be the most costly fault category in, for instance, avionics. The relatively few papers in this area rarely deal with analogue integrated systems. In this paper a simple simulation model has been developed for a particular type of NFF, the intermittent resistive fault resulting from bad interconnections. Simulations have been carried out with respect to a CMOS operational amplifier under influence of NFFs, and the resulting behaviour under different fault conditions has been examined
Analogue fault simulation is needed to evaluate the quality of tests, but is very computationally in...
A SPICE macromodel of a CMOS operational amplifier is described in which the supply current is model...
High level modelling (HLM) for operational amplifiers (op amps) has been previously carried out succ...
A major threat in extremely dependable high-end process node integrated systems in e.g. Avionics are...
No fault found (NFF) is a major threat in extremely dependable high-end process node integrated syst...
The required dependability of integrated CMOS systems has to be continuously increased because nowad...
The reliability of CMOS circuits has worsened due to technology scaling. From the review of previous...
This paper presents a probabilistic approach to the detection of analog faults (i.e., transistors st...
In this paper, we propose a simulation-before-test (SBT) fault diagnosis methodology based on the us...
In this paper, a new approach for transient concurrent analogue fault simulation is presented. The e...
Abstract A new approach for analog fault modeling and simulation is presented. The proposed approach...
A methodology for locating faults in analog integrated circuits using an analog fault simulator is p...
The purpose of this research is to develop effective simulation methods for electrically oriented fa...
A novel method for analogue high-level fault simulation (HLFS) using linear and non-linear high-leve...
The paper is focused on nonlinear analog circuits, with the special attention paid to circuits compr...
Analogue fault simulation is needed to evaluate the quality of tests, but is very computationally in...
A SPICE macromodel of a CMOS operational amplifier is described in which the supply current is model...
High level modelling (HLM) for operational amplifiers (op amps) has been previously carried out succ...
A major threat in extremely dependable high-end process node integrated systems in e.g. Avionics are...
No fault found (NFF) is a major threat in extremely dependable high-end process node integrated syst...
The required dependability of integrated CMOS systems has to be continuously increased because nowad...
The reliability of CMOS circuits has worsened due to technology scaling. From the review of previous...
This paper presents a probabilistic approach to the detection of analog faults (i.e., transistors st...
In this paper, we propose a simulation-before-test (SBT) fault diagnosis methodology based on the us...
In this paper, a new approach for transient concurrent analogue fault simulation is presented. The e...
Abstract A new approach for analog fault modeling and simulation is presented. The proposed approach...
A methodology for locating faults in analog integrated circuits using an analog fault simulator is p...
The purpose of this research is to develop effective simulation methods for electrically oriented fa...
A novel method for analogue high-level fault simulation (HLFS) using linear and non-linear high-leve...
The paper is focused on nonlinear analog circuits, with the special attention paid to circuits compr...
Analogue fault simulation is needed to evaluate the quality of tests, but is very computationally in...
A SPICE macromodel of a CMOS operational amplifier is described in which the supply current is model...
High level modelling (HLM) for operational amplifiers (op amps) has been previously carried out succ...