Problems in testing scannable sequential circuits for delay faults are addressed. Modifications to improve circuit controllability and observability for the testing of delay faults are implemented efficiently in a scan cell design. A layout on a gate array is designed and evaluated for this scan cel
Asynchronous circuits operate correctly only under tim-ing assumptions. Hence testing those circuits...
Abstract—Path delay fault testing has become increasingly important due to higher clock rates and hi...
Modern day IC design has drawn a lot of attention towards the path delay fault model (PDF) [1], whic...
Problems in testing scannable sequential circuits for delay faults are addressed. Modifications to i...
International audienceDelay testing that requires the application of consecutive two-pattern tests i...
MO- WORK REPOmD on delay testing is applicable only to the scan type of circuits. This restricted pr...
Also in: European Test Workshop (ETW), 27 au 29 mai 1998, Barcelona, Espagne, pp. 44-48International...
Abstract — With increasing process fluctuations in nano-scale technology, testing for delay faults i...
Enhanced Scan design can significantly improve the fault coverage for two pattern delay tests at the...
Delay Fault Testing using scan patterns has been increasingly popular in the DFT world. There’s a ...
This article presents a technique for the extension of delay fault test pattern generation to synchr...
Arbitrary two-pattern delay tests are difficult to apply with a standard scan path
A new on-chip embedding mechanism to improve fault coverage in scan-based de-lay test is proposed. A...
This paper presents a hybrid scan-based transition delay fault test. The proposed technique controls...
As the clock frequency and complexity of digital integrated circuits increase rapidly, delay testing...
Asynchronous circuits operate correctly only under tim-ing assumptions. Hence testing those circuits...
Abstract—Path delay fault testing has become increasingly important due to higher clock rates and hi...
Modern day IC design has drawn a lot of attention towards the path delay fault model (PDF) [1], whic...
Problems in testing scannable sequential circuits for delay faults are addressed. Modifications to i...
International audienceDelay testing that requires the application of consecutive two-pattern tests i...
MO- WORK REPOmD on delay testing is applicable only to the scan type of circuits. This restricted pr...
Also in: European Test Workshop (ETW), 27 au 29 mai 1998, Barcelona, Espagne, pp. 44-48International...
Abstract — With increasing process fluctuations in nano-scale technology, testing for delay faults i...
Enhanced Scan design can significantly improve the fault coverage for two pattern delay tests at the...
Delay Fault Testing using scan patterns has been increasingly popular in the DFT world. There’s a ...
This article presents a technique for the extension of delay fault test pattern generation to synchr...
Arbitrary two-pattern delay tests are difficult to apply with a standard scan path
A new on-chip embedding mechanism to improve fault coverage in scan-based de-lay test is proposed. A...
This paper presents a hybrid scan-based transition delay fault test. The proposed technique controls...
As the clock frequency and complexity of digital integrated circuits increase rapidly, delay testing...
Asynchronous circuits operate correctly only under tim-ing assumptions. Hence testing those circuits...
Abstract—Path delay fault testing has become increasingly important due to higher clock rates and hi...
Modern day IC design has drawn a lot of attention towards the path delay fault model (PDF) [1], whic...
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