Large Signal Excitation Measurement Techniques for Random Telegraph Signal Noise in MOSFETs
- Hoekstra, E.
- Kolhatkar, J.S.
- van der Wel, A.P.
- Salm, Cora
- Klumperink, Eric A.M.
DOIAbstract
This paper introduces large signal excitation measurement techniques to analyze Random Telegraph Signal (RTS) noise originating from oxide-traps in MOSFETs. The paper concentrates on the trap-occupancy, which relates directly to the generated noise. The proposed measurement technique makes trap-occupancy observation possible for every bias-situation, including the OFF-state of the transistor
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