We present a computational and experimental study on interface passivation of B4C/La multilayers for photolithography at wavelengths beyond 13.5 nm. We successfully applied N-plasma treatment to form interface-localized BN and LaN layers, preventing LaB6 and LaC2 interlayer formation and increasing the optical contrast. Experiments suggest an improvement of absolute reflection by up to 20% for 200 period multilayers, with a best-so-far result of 41.5 % at near-normal incidence of 6.7 n
Key in designing the next generation of EUVL optics, i.e. at the wavelength of 6.x nm, will be match...
Results on optimization and manufacturing of La B4C multilayers are reported. Such mirrors are prom...
Results on optimization and manufacturing of La B4C multilayers are reported. Such mirrors are prom...
A potential candidate for the new generation lithography beyond EUV is La/B4C multilayer optics for ...
Reported is a computational and chemical analysis of near normal incidence reflective multilayer opt...
Reported is a computational and chemical analysis of near normal incidence reflective multilayer opt...
Radiation of 6.x nm wavelength is a possible candidate for the next generation of optical lithograph...
For future photolithography processes, the wavelength of 6 nm may offer improved imaging specs. The ...
Beyond EUV lithography at 6.X nm wavelength has a potential to extend EUVL beyond the 11 nm node. To...
We report a hybrid thin-film deposition procedure to significantly enhance the reflectivity of La/B-...
We report a hybrid thin-film deposition procedure to significantly enhance the reflectivity of La/B-...
EUVL at 6.x nm is one of the candidates for the next generation photolithography. Its design require...
The interfaces in La/B4C and LaN/B4C multilayer mirrors designed for near normal incidence reflectio...
Chemical diffusion and interlayer formation in thin layers and at interfaces is of increasing influe...
Chemical diffusion and interlayer formation in thin layers and at interfaces is of increasing influe...
Key in designing the next generation of EUVL optics, i.e. at the wavelength of 6.x nm, will be match...
Results on optimization and manufacturing of La B4C multilayers are reported. Such mirrors are prom...
Results on optimization and manufacturing of La B4C multilayers are reported. Such mirrors are prom...
A potential candidate for the new generation lithography beyond EUV is La/B4C multilayer optics for ...
Reported is a computational and chemical analysis of near normal incidence reflective multilayer opt...
Reported is a computational and chemical analysis of near normal incidence reflective multilayer opt...
Radiation of 6.x nm wavelength is a possible candidate for the next generation of optical lithograph...
For future photolithography processes, the wavelength of 6 nm may offer improved imaging specs. The ...
Beyond EUV lithography at 6.X nm wavelength has a potential to extend EUVL beyond the 11 nm node. To...
We report a hybrid thin-film deposition procedure to significantly enhance the reflectivity of La/B-...
We report a hybrid thin-film deposition procedure to significantly enhance the reflectivity of La/B-...
EUVL at 6.x nm is one of the candidates for the next generation photolithography. Its design require...
The interfaces in La/B4C and LaN/B4C multilayer mirrors designed for near normal incidence reflectio...
Chemical diffusion and interlayer formation in thin layers and at interfaces is of increasing influe...
Chemical diffusion and interlayer formation in thin layers and at interfaces is of increasing influe...
Key in designing the next generation of EUVL optics, i.e. at the wavelength of 6.x nm, will be match...
Results on optimization and manufacturing of La B4C multilayers are reported. Such mirrors are prom...
Results on optimization and manufacturing of La B4C multilayers are reported. Such mirrors are prom...