Stress development in thin yttrium films on hard substrates during hydrogen loading
- Dornheim, M.
- Pundt, A.
- Kirchheim, R.
- van der Molen, S.J.
- Kooij, E.S.
- Kerssemakers, J.W.J.
- Griessen, R.P.
- Harms, H.
- Geyer, U.
Publication date
January 2003
DOIAbstract
The stress development in thin yttrium films during hydrogen loading was analyzed. A linear elastic model was used to predict the behavior of clamped thin films. The results show that the net stress in Y-H films remain comparably small which is the reason for the good mechanical stability of the Y-H switchable mirrors during H cycling
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