Item Overexposure in Computerized Classification Tests Using Sequential Item Selection

Computerized classification tests (CCTs) often use sequential item selection which administers items according to maximizing psychometric information at a cut point demarcating passing and failing scores. This paper illustrates why this method of item selection leads to the overexposure of a significant number of items, and the performances of three different methods for controlling maximum item exposure rates in CCTs are compared. Specifically, the Sympson-Hetter, restricted, and item eligibility methods are examined in two studies realistically simulating different types of CCTs and are evaluated based upon criteria including classification accuracy, the number of items exceeding the desired maximum exposure rate, and test overlap. The pros and cons of each method are discussed from a practical perspective