Specular and non-specular X-ray reflection from inorganic and organic multilayers.
- Boer, de, D.K.G.
- Leenaers, A.J.G.
- Wielen, van der, M.W.J.
- Cohen Stuart, M.A.
- Fleer, G.J.
- Nieuwhof, R.P.
- Marcelis, A.T.M.
- Sudhölter, E.J.R.
DOIAbstract
Specular and non-specular X-ray reflectivity measurements can be exploited to obtain interesting properties of layered materials such as electron-density profile and lateral and perpendicular structure of interface roughness. This will be illustrated using results on a nickel–carbon multilayer and a liquid-crystalline polymer
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