The present research is devoted to creation of a new low-cost miniaturised measurement system for determination of potential difference in real time and with high measurement resolution. Furthermore, using the electrode of the reference probe, Kelvin method leads to both an indirect measurement of electronic work function or contact potential of the sample and measurement of a surface potential for insulator type samples. The bucking voltage in this system is composite and comprises a periodically variable component. The necessary steps for development of signal processing and tracking are described in detail
At present for analysis of the homogeneity of materials properties are becoming widely used various ...
Kelvin probe force microscopy is a scanning probe method for imaging the surface potential by atomic...
Kelvin probe force microscopy (KPFM), a characterization method that could image surface potentials ...
Determination of electric potential difference using the Kelvin probe, i.e. vibrating capacitor tech...
Abstract. A home-built Kelvin force microscope combined with a spectroscopic method is dedicated to ...
We present a new instrument for contact potential measurements, combining the well-known principle o...
The paper presents the results of the development of a method and means of measuring the contact pot...
Contact potential difference (CPD) was measured by macroscopic Kelvin probe instrument and scanning...
In this project, the design and build up of a measurement system for a scanning Kelvin probe system ...
Volta potential of a material can be easily determined by using scanning Kelvin probe (SKP), but up ...
A micro Kelvin probe has been developed for local work function measurements. In this device the dis...
The practical feasibility of using a Kelvin Probe as a novel reference electrode in the measurement ...
This thesis reports on the application of the Kelvin probe in materials science and in particular on...
International audienceA method is proposed to estimate the lateral resolution of surface potential p...
Analysis of linear spatial resolution of vibrating Kelvin–Zisman electrode is carried out in case wh...
At present for analysis of the homogeneity of materials properties are becoming widely used various ...
Kelvin probe force microscopy is a scanning probe method for imaging the surface potential by atomic...
Kelvin probe force microscopy (KPFM), a characterization method that could image surface potentials ...
Determination of electric potential difference using the Kelvin probe, i.e. vibrating capacitor tech...
Abstract. A home-built Kelvin force microscope combined with a spectroscopic method is dedicated to ...
We present a new instrument for contact potential measurements, combining the well-known principle o...
The paper presents the results of the development of a method and means of measuring the contact pot...
Contact potential difference (CPD) was measured by macroscopic Kelvin probe instrument and scanning...
In this project, the design and build up of a measurement system for a scanning Kelvin probe system ...
Volta potential of a material can be easily determined by using scanning Kelvin probe (SKP), but up ...
A micro Kelvin probe has been developed for local work function measurements. In this device the dis...
The practical feasibility of using a Kelvin Probe as a novel reference electrode in the measurement ...
This thesis reports on the application of the Kelvin probe in materials science and in particular on...
International audienceA method is proposed to estimate the lateral resolution of surface potential p...
Analysis of linear spatial resolution of vibrating Kelvin–Zisman electrode is carried out in case wh...
At present for analysis of the homogeneity of materials properties are becoming widely used various ...
Kelvin probe force microscopy is a scanning probe method for imaging the surface potential by atomic...
Kelvin probe force microscopy (KPFM), a characterization method that could image surface potentials ...