Direct analytical calculations of the static dielectric permittivity-dependent electron mobility due to different elastic scattering mechanisms for n-type InSb were carried out. The calculated static dielectric permittivity increases by increasing of donor concentration. The temperature dependence of the electron mobility from 10 K up to 300 K has been demonstrated. Generally, the electron mobility shows peak behavior in this range of temperatures. The direct correlation between the electron mobility and the static dielectric permittivity at 300 K was investigated. The dependence of the electron mobility on donor concentration was discussed both when the static dielectric permittivity is assumed to be varying and when it is assumed to be a ...
Electrical transport (electrical conductivity and Hall effect) studies have been performed on n-InSb...
In a compound semiconductor which lacks inversion symmetry, the free electrons interact simultaneous...
This Investigation was undertaken in an effort to compare the electrical properties of thin layers o...
Available experimental values of electron mobility in InSb samples with known impurity concentration...
Calculations of the electron mobility of n-type InSb have been performed at different temperature re...
The electron mobility in n-InSb at 77°K is calculated by the variational method and compared with ex...
Values of hot-electron mobility in InSb calculated by using the Monte Carlo method are presented and...
Abstract: The aim of this study is studying the influence of the donor concentration and temperature...
The drift and Hall mobilities of electrons are calculated for various degrees of impurity content in...
Electrical transport properties of n and p-type InSb in the temperature range 6.2-300K have been st...
The electrical conductivity of n-type InSb in the temperature range 77K - 300K has been calculated ...
An attempt is made to study theoretically the low- and high-field longitudinal diffusivity of n-InSb...
Hot electron microwave incremental conductivity of n-InSb at 77°K in the presence of ionized impurit...
Low- and high-field magnetotransport measurements on 30 nm δ-doped InSb/AlInSb quantum wells with di...
Low- and high-field magnetotransport measurements on 30 nm δ-doped InSb/AlInSb quantum wells with di...
Electrical transport (electrical conductivity and Hall effect) studies have been performed on n-InSb...
In a compound semiconductor which lacks inversion symmetry, the free electrons interact simultaneous...
This Investigation was undertaken in an effort to compare the electrical properties of thin layers o...
Available experimental values of electron mobility in InSb samples with known impurity concentration...
Calculations of the electron mobility of n-type InSb have been performed at different temperature re...
The electron mobility in n-InSb at 77°K is calculated by the variational method and compared with ex...
Values of hot-electron mobility in InSb calculated by using the Monte Carlo method are presented and...
Abstract: The aim of this study is studying the influence of the donor concentration and temperature...
The drift and Hall mobilities of electrons are calculated for various degrees of impurity content in...
Electrical transport properties of n and p-type InSb in the temperature range 6.2-300K have been st...
The electrical conductivity of n-type InSb in the temperature range 77K - 300K has been calculated ...
An attempt is made to study theoretically the low- and high-field longitudinal diffusivity of n-InSb...
Hot electron microwave incremental conductivity of n-InSb at 77°K in the presence of ionized impurit...
Low- and high-field magnetotransport measurements on 30 nm δ-doped InSb/AlInSb quantum wells with di...
Low- and high-field magnetotransport measurements on 30 nm δ-doped InSb/AlInSb quantum wells with di...
Electrical transport (electrical conductivity and Hall effect) studies have been performed on n-InSb...
In a compound semiconductor which lacks inversion symmetry, the free electrons interact simultaneous...
This Investigation was undertaken in an effort to compare the electrical properties of thin layers o...