We study how useful random states are for quantum metrology, i.e., whether they surpass the classical limits imposed on precision in the canonical phase sensing scenario. First, we prove that random pure states drawn from the Hilbert space of distinguishable particles typically do not lead to superclassical scaling of precision even when allowing for local unitary optimization. Conversely, we show that random pure states from the symmetric subspace typically achieve the optimal Heisenberg scaling without the need for local unitary optimization. Surprisingly, the Heisenberg scaling is observed for random isospectral states of arbitrarily low purity and preserved under loss of a fixed number of particles. Moreover, we prove that for pure stat...
We show the following: a randomly chosen pure state as a resource for measurement-based quantum comp...
Measurement noise is a major source of noise in quantum metrology. Here, we explore preprocessing pr...
Quantum enhancements of precision in metrology can be compromised by system imperfections. These may...
We search for the optimal quantum pure states of identical bosonic particles for applications in qua...
We search for the optimal quantum pure states of identical bosonic particles for applications in qua...
Quantum interferences offer the potential for improving the effective resolution wavelength of many ...
Quantum interferences offer the potential for improving the effective resolution wavelength of many ...
Quantum interferences offer the potential for improving the effective resolution wavelength of many ...
Quantum metrology aims to exploit quantum phenomena to overcome classical limitations in the estimat...
We search for the optimal quantum pure states of identical bosonic particles for applications in qu...
12 pages, 2 figures, double column, (New: typos corrected, improved figures)Quantum metrology is a p...
The problem of estimating an unknown phase ϕ using two-level probes in the presence of unital phase-...
A central feature of quantum metrology is the possibility of Heisenberg scaling, a quadratic improve...
The problem of estimating an unknown phase ϕ using two-level probes in the presence of unital phase-...
We show that measuring any two quantum states by a random POVM, under a suitable definition of rando...
We show the following: a randomly chosen pure state as a resource for measurement-based quantum comp...
Measurement noise is a major source of noise in quantum metrology. Here, we explore preprocessing pr...
Quantum enhancements of precision in metrology can be compromised by system imperfections. These may...
We search for the optimal quantum pure states of identical bosonic particles for applications in qua...
We search for the optimal quantum pure states of identical bosonic particles for applications in qua...
Quantum interferences offer the potential for improving the effective resolution wavelength of many ...
Quantum interferences offer the potential for improving the effective resolution wavelength of many ...
Quantum interferences offer the potential for improving the effective resolution wavelength of many ...
Quantum metrology aims to exploit quantum phenomena to overcome classical limitations in the estimat...
We search for the optimal quantum pure states of identical bosonic particles for applications in qu...
12 pages, 2 figures, double column, (New: typos corrected, improved figures)Quantum metrology is a p...
The problem of estimating an unknown phase ϕ using two-level probes in the presence of unital phase-...
A central feature of quantum metrology is the possibility of Heisenberg scaling, a quadratic improve...
The problem of estimating an unknown phase ϕ using two-level probes in the presence of unital phase-...
We show that measuring any two quantum states by a random POVM, under a suitable definition of rando...
We show the following: a randomly chosen pure state as a resource for measurement-based quantum comp...
Measurement noise is a major source of noise in quantum metrology. Here, we explore preprocessing pr...
Quantum enhancements of precision in metrology can be compromised by system imperfections. These may...