A spectral-domain white-light interferometric technique of measuring the effective thickness of optical elements of known dispersion is presented when a Michelson interferometer with a cube beam splitter is not dispersion balanced and when the spectral interference fringes are resolved over a wide wavelength range. The technique uses processing one of the recorded spectral interferograms by an adequate method to retrieve the unwrapped phase function, the ambiguity of which is removed by a simple procedure based on linear dependence of the optical path difference between interferometer beams on the refractive index of optical elements. The effective thickness of optical elements is given by the slope of the linear dependence. The tec...
We present a new white-light interferometric technique to measure the group index of holey fibres ov...
We present a method to experimentally measure the complex reflection and transmission coefficients o...
The object of this paper is to describe and account for certain interference phenomena which are ob...
In spectral domain interferometry, the interference signal generated by directly reflected waves fro...
We present a white-light spectral interferometric technique for measuring the thickness of SiO2 thin...
We present a white-light spectral interferometric technique employing a low-resolution spectrometer ...
The objective is to develop and test a spectral interferometric technique that enables measurements ...
International audienceFor a long time, obtaining the optical and morphological properties of a trans...
We present a new two-step white-light spectral interferometric technique to measure a nonlinear phas...
Method to accurately measure both refractive index and the thickness of glass is investigated. The m...
International audienceIn the domain of optical metrology, white light interference microscopy is mai...
a highly accurate white light interference model was developed from just a few key parameters charac...
$^{\ast}$ This investigation was carried out under a contract between The Air Force Cambridge Resear...
Spectrally resolved white-light phase-shifting interference microscopy can be used for rapid and acc...
[[abstract]]It is well known that white light interferometry (WLI) is important to nano-scale 3-D pr...
We present a new white-light interferometric technique to measure the group index of holey fibres ov...
We present a method to experimentally measure the complex reflection and transmission coefficients o...
The object of this paper is to describe and account for certain interference phenomena which are ob...
In spectral domain interferometry, the interference signal generated by directly reflected waves fro...
We present a white-light spectral interferometric technique for measuring the thickness of SiO2 thin...
We present a white-light spectral interferometric technique employing a low-resolution spectrometer ...
The objective is to develop and test a spectral interferometric technique that enables measurements ...
International audienceFor a long time, obtaining the optical and morphological properties of a trans...
We present a new two-step white-light spectral interferometric technique to measure a nonlinear phas...
Method to accurately measure both refractive index and the thickness of glass is investigated. The m...
International audienceIn the domain of optical metrology, white light interference microscopy is mai...
a highly accurate white light interference model was developed from just a few key parameters charac...
$^{\ast}$ This investigation was carried out under a contract between The Air Force Cambridge Resear...
Spectrally resolved white-light phase-shifting interference microscopy can be used for rapid and acc...
[[abstract]]It is well known that white light interferometry (WLI) is important to nano-scale 3-D pr...
We present a new white-light interferometric technique to measure the group index of holey fibres ov...
We present a method to experimentally measure the complex reflection and transmission coefficients o...
The object of this paper is to describe and account for certain interference phenomena which are ob...