This work studies the effects of an aluminum covering on the performance of cross-like Hall devices. Four different Hall sensor structures of various sizes were designed and fabricated. The sensitivity and offset of the Hall sensors, two key points impacting their performance, were characterized using a self-built measurement system. The work analyzes the influences of the aluminum covering on those two aspects of the performance. The aluminum layer covering mainly leads to an eddy-current effect in an unstable magnetic field and an additional depletion region above the active region. Those two points have influences on the sensitivity and the offset voltage, respectively. The analysis guides the designer whether to choose covering with an ...
This paper analyses sensitivity of Hall devices in the horizontal and vertical forms operating in th...
Several Hall effect sensors were modeled and evaluated regarding the Hall voltage and sensitivity us...
The paper presents numerical model and validation of new methodology of offset voltage minimization ...
This work studies the effects of an aluminum covering on the performance of cross-like Hall devices....
This paper studies the effects of the covering layers on the performance of a cross-like Hall plate....
Several Hall sensor configurations have been integrated in CMOS technology and analyzed in terms of ...
In this paper, a new single-device three-dimensional (3D) Hall sensor called a cross-shaped 3D Hall ...
In many applications, a Hall element is used for contact-less measurement such as linear and angular...
In this paper, the performance of CMOS Hall Effect Sensors with four different geometries has been e...
This manuscript analyzes the effects of design parameters, such as aspect ratio, doping concentratio...
This paper studies Hall effect sensor current-related sensitivity in terms of its dependence on elec...
In this paper the magnetic field detection limits of microscopic Hall sensors are investigated as a ...
Experiments relevant to the development an integrated Hall effect sensor have been performed. Carrie...
The present paper focuses on evaluating the temperature effects on Hall Effect sensors sensitivity b...
Silicon Hall plates show an offset of a few millitesla. A large portion of this offset is caused by ...
This paper analyses sensitivity of Hall devices in the horizontal and vertical forms operating in th...
Several Hall effect sensors were modeled and evaluated regarding the Hall voltage and sensitivity us...
The paper presents numerical model and validation of new methodology of offset voltage minimization ...
This work studies the effects of an aluminum covering on the performance of cross-like Hall devices....
This paper studies the effects of the covering layers on the performance of a cross-like Hall plate....
Several Hall sensor configurations have been integrated in CMOS technology and analyzed in terms of ...
In this paper, a new single-device three-dimensional (3D) Hall sensor called a cross-shaped 3D Hall ...
In many applications, a Hall element is used for contact-less measurement such as linear and angular...
In this paper, the performance of CMOS Hall Effect Sensors with four different geometries has been e...
This manuscript analyzes the effects of design parameters, such as aspect ratio, doping concentratio...
This paper studies Hall effect sensor current-related sensitivity in terms of its dependence on elec...
In this paper the magnetic field detection limits of microscopic Hall sensors are investigated as a ...
Experiments relevant to the development an integrated Hall effect sensor have been performed. Carrie...
The present paper focuses on evaluating the temperature effects on Hall Effect sensors sensitivity b...
Silicon Hall plates show an offset of a few millitesla. A large portion of this offset is caused by ...
This paper analyses sensitivity of Hall devices in the horizontal and vertical forms operating in th...
Several Hall effect sensors were modeled and evaluated regarding the Hall voltage and sensitivity us...
The paper presents numerical model and validation of new methodology of offset voltage minimization ...