A molecular dynamics model is presented, which adds harmonic potentials to the atomic interactions to mimic the elastic properties of an AFM cantilever. It gives new insight into the correlation between the experimentally monitored frequency shift and cantilever damping due to the interaction between tip atoms and scanned surface. Applying the model to ionic crystals with rock salt structure two damping mechanisms are investigated, which occur separately or simultaneously depending on the tip position. These mechanisms are adhesion hysteresis on the one hand and lateral excitations of the cantilever on the other. We find that the short range Lennard-Jones part of the atomic interaction alone is sufficient for changing the predominant mechan...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
We study the coupling of lateral and normal tip oscillations and its effect on the imaging process o...
Numerical simulations of the frequency modulation atomic force microscope, including the whole dynam...
A possible mechanism of atomic scale dissipation in non-contact atomic force microscopy (NC-AFM) is ...
Cataloged from PDF version of article.We analyze the steady state tip sample interaction in atomic f...
Molecular dynamics (MD) simulations were used to model amplitude modulation atomic force microscopy ...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
In most commercial atomic force microscopes, dynamic modes are now available as standard operation m...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
We study the coupling of lateral and normal tip oscillations and its effect on the imaging process o...
Numerical simulations of the frequency modulation atomic force microscope, including the whole dynam...
A possible mechanism of atomic scale dissipation in non-contact atomic force microscopy (NC-AFM) is ...
Cataloged from PDF version of article.We analyze the steady state tip sample interaction in atomic f...
Molecular dynamics (MD) simulations were used to model amplitude modulation atomic force microscopy ...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
In most commercial atomic force microscopes, dynamic modes are now available as standard operation m...
Increasing the signal-to-noise ratio in dynamic atomic force microscopy plays a key role in nanomech...
An atomic force microscope which is operated in the oscillating mode is an example of an impact osci...
Atomic Force Microscopes (AFMs) are powerful devices used for surface analysis in nano-electronics, ...