The study of radiation damage of EPROM 2764 memory
- Domanski Grzegorz
- Konarzewski Bogumil
- Kurjata Robert
- Marzec Janusz
- Zaremba Krzysztof
- Dziewiecki Michal
- Ziembicki Marcin
- Rychter Andrzej
Publication date
January 2016
DOI Publisher
VINCA Institute of Nuclear Sciences ISSN
1451-3994 Journal
issn:1451-3994Abstract
A simple statistical theory of radiation damage of semiconductor memory has been constructed. The radiation damage of EPROM memory has been investigated. The measured number of damaged bytes is significantly lower than the expected number resulting from the purely random distribution of the damaged bits. In this way it has been proven that there is a correlation between the failures of individual memory bits which are located in the same byte
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