International audienceThe Microelectronics and Photonics Testbed (MPTB) carrying twenty-four experiments on-board a scientific satellite is in a high radiation orbit since November 1997. This paper presents SEU flight results on two commercial static RAMs includes in two of the MPTB experiments
The NASA Cooperative Agreement NAG4-210 was granted under the FY2000 Faculty Awards for Research (FA...
9th European Workshop on Radiation and its Effects on Components and Systems, Athens, GREECE, SEP 27...
We present a description of the Microelectronics and Photonics Test Bed (MPTB) Dual-Rate 1773 (DR177...
International audienceThe Microelectronics and Photonics Testbed (MPTB) carrying twenty-four experim...
International Telemetering Conference Proceedings / October 17-20, 1988 / Riviera Hotel, Las Vegas, ...
This paper describes a comparison between in-orbit single-event effects (SEE) rate measurement acqui...
The Memory Test Experiment is a space test of a ferroelectric memory device on a low Earth orbit sat...
The Microelectronics and Photonics Testbed (MPTB) carrying twenty-four experiments on-board a scient...
International audienceIntegrated circuits are sensitive to the effects of natural radiation. This pa...
This paper presents the vulnerabilities of single event effects (SEEs) simulated by heavy ions on gr...
As we continue to advance in exploring space frontiers, technology must also advance. The need for f...
International audienceAn experimental platform including 1 Gigabit memory built from 90 nm SRAMs was...
This experiment investigated the integrity of static computer memory (floppy disk media) when expose...
The Microelectronics Testing and Technology Obsolescence Program (METTOP) at New Mexico Tech has bee...
IEEE International Conference on Integrated Circuit Design and Technology, Grenoble, FRANCE, JUN 02-...
The NASA Cooperative Agreement NAG4-210 was granted under the FY2000 Faculty Awards for Research (FA...
9th European Workshop on Radiation and its Effects on Components and Systems, Athens, GREECE, SEP 27...
We present a description of the Microelectronics and Photonics Test Bed (MPTB) Dual-Rate 1773 (DR177...
International audienceThe Microelectronics and Photonics Testbed (MPTB) carrying twenty-four experim...
International Telemetering Conference Proceedings / October 17-20, 1988 / Riviera Hotel, Las Vegas, ...
This paper describes a comparison between in-orbit single-event effects (SEE) rate measurement acqui...
The Memory Test Experiment is a space test of a ferroelectric memory device on a low Earth orbit sat...
The Microelectronics and Photonics Testbed (MPTB) carrying twenty-four experiments on-board a scient...
International audienceIntegrated circuits are sensitive to the effects of natural radiation. This pa...
This paper presents the vulnerabilities of single event effects (SEEs) simulated by heavy ions on gr...
As we continue to advance in exploring space frontiers, technology must also advance. The need for f...
International audienceAn experimental platform including 1 Gigabit memory built from 90 nm SRAMs was...
This experiment investigated the integrity of static computer memory (floppy disk media) when expose...
The Microelectronics Testing and Technology Obsolescence Program (METTOP) at New Mexico Tech has bee...
IEEE International Conference on Integrated Circuit Design and Technology, Grenoble, FRANCE, JUN 02-...
The NASA Cooperative Agreement NAG4-210 was granted under the FY2000 Faculty Awards for Research (FA...
9th European Workshop on Radiation and its Effects on Components and Systems, Athens, GREECE, SEP 27...
We present a description of the Microelectronics and Photonics Test Bed (MPTB) Dual-Rate 1773 (DR177...