Add to ORKGSingle Event Transients (SETs) are one of the major concern for Flash-based Field Programmable Gate Arrays (FPGAs). In this paper, we propose a new analysis to characterize the SET phenomena within Flash-based FPGAs
Radiation-induced soft errors have become a significant reliability challenge in modern CMOS logic. ...
International audienceSingle-event transients (SETs) remain a concern in field-programmable gate arr...
In the present paper, we propose a new design flow for the analysis and the implementation of circui...
The present work proposes a methodology to predict radiation-induced Single Event Transient (SET) ph...
Reliability of Integrated Circuits (ICs) it is nowadays a major concern for deep sub-micron technol...
This paper proposes a mapping tool for selectively mitigate radiation-induced Single Event Transient...
Due to the decreasing feature sizes of VLSI circuits, radiation induced Single Event Transients (SET...
SRAM-based FPGAs are widely used in mission critical applications, such as aerospace and avionics. D...
Thanks to the immunity against Single Event Upsets in configuration memory, Flash-based FPGA is beco...
Flash-based Field Programmable Gate Array (FPGA) devices are nowadays golden cores of many applicati...
The increasing technology node scaling makes VLSI devices extremely vulnerable to Single Event Effec...
SRAM-based FPGAs are widely used in mission critical applications. Due to the increasing working fre...
Analysis of single event transients (SETs) generated in field programmable gate arrays (FPGA) under ...
The higher resiliency of Flash-based FPGAs to Single Event Upsets (SEUs) with respect to other non r...
Mitigation techniques for SET effects introduce severe timing penalties to the hardened circuit. In ...
Radiation-induced soft errors have become a significant reliability challenge in modern CMOS logic. ...
International audienceSingle-event transients (SETs) remain a concern in field-programmable gate arr...
In the present paper, we propose a new design flow for the analysis and the implementation of circui...
The present work proposes a methodology to predict radiation-induced Single Event Transient (SET) ph...
Reliability of Integrated Circuits (ICs) it is nowadays a major concern for deep sub-micron technol...
This paper proposes a mapping tool for selectively mitigate radiation-induced Single Event Transient...
Due to the decreasing feature sizes of VLSI circuits, radiation induced Single Event Transients (SET...
SRAM-based FPGAs are widely used in mission critical applications, such as aerospace and avionics. D...
Thanks to the immunity against Single Event Upsets in configuration memory, Flash-based FPGA is beco...
Flash-based Field Programmable Gate Array (FPGA) devices are nowadays golden cores of many applicati...
The increasing technology node scaling makes VLSI devices extremely vulnerable to Single Event Effec...
SRAM-based FPGAs are widely used in mission critical applications. Due to the increasing working fre...
Analysis of single event transients (SETs) generated in field programmable gate arrays (FPGA) under ...
The higher resiliency of Flash-based FPGAs to Single Event Upsets (SEUs) with respect to other non r...
Mitigation techniques for SET effects introduce severe timing penalties to the hardened circuit. In ...
Radiation-induced soft errors have become a significant reliability challenge in modern CMOS logic. ...
International audienceSingle-event transients (SETs) remain a concern in field-programmable gate arr...
In the present paper, we propose a new design flow for the analysis and the implementation of circui...