A study was made of the influence of direction of growth, melt composition and growth speed upon the relative occurrence of the residual acceptor centres in melt-grown GaSb single crystals. Special attention was given to effects arising from the fact that the solid-liquid interface can be more or less faceted during growth. Crystal growth in the [111] direction was found to be different from growth in the [111] direction. In the discussion the possibility of a simple defect centre is ruled out and it is shown that of the more complex centres the GaSbVGaa centre fits the present data best
Dilute Te-doped GaSb alloys have been prepared by the vertical feeding method (VFM) using both casti...
For the solidification process, the thermal factor, in particular, temperature gradients in solid an...
We présent in this paper a study by RHEED oscillations intensities of the growth of GaSb by M.B.E. F...
Spatial compositional analysis has been carried out on single and polycrystal wafers of GaSb grown f...
Investigations related to the bulk and thin film growth of two of the antimony based semiconductors,...
Undoped and Te-doped gallium antimonide (GaSb) layers have been grown on GaSb bulk substrates by the...
We characterized GaSb single crystals containing different dopants (Al, Cd and Te), grown by the Czo...
The effects of gravity and crystal orientation on the dissolution of GaSb into InSb melt and the rec...
This paper presents the results of our interface demarcation experiments during vertical Bridgman gr...
GaSb and InGaSb have been demonstrated to be suitable choices for high efficiency thermophotovoltaic...
The effect of growth parameters on the position of the interface in the melt growth of indium antimo...
Numerical analysis has been carried out to determine the deviation of the growth rate from the ampou...
Radially homogeneous bulk alloys of GaxIn1-xSb in the range 0.7 < x < 0.8, have been grown by vertic...
Attempts were made to grow alloy crystals of Ga{sub 1{minus}x}In{sub x}Sb by the conventional Czochr...
The homogeneity and luminescence properties of undoped bulk GaSb have been studied by the cathodolum...
Dilute Te-doped GaSb alloys have been prepared by the vertical feeding method (VFM) using both casti...
For the solidification process, the thermal factor, in particular, temperature gradients in solid an...
We présent in this paper a study by RHEED oscillations intensities of the growth of GaSb by M.B.E. F...
Spatial compositional analysis has been carried out on single and polycrystal wafers of GaSb grown f...
Investigations related to the bulk and thin film growth of two of the antimony based semiconductors,...
Undoped and Te-doped gallium antimonide (GaSb) layers have been grown on GaSb bulk substrates by the...
We characterized GaSb single crystals containing different dopants (Al, Cd and Te), grown by the Czo...
The effects of gravity and crystal orientation on the dissolution of GaSb into InSb melt and the rec...
This paper presents the results of our interface demarcation experiments during vertical Bridgman gr...
GaSb and InGaSb have been demonstrated to be suitable choices for high efficiency thermophotovoltaic...
The effect of growth parameters on the position of the interface in the melt growth of indium antimo...
Numerical analysis has been carried out to determine the deviation of the growth rate from the ampou...
Radially homogeneous bulk alloys of GaxIn1-xSb in the range 0.7 < x < 0.8, have been grown by vertic...
Attempts were made to grow alloy crystals of Ga{sub 1{minus}x}In{sub x}Sb by the conventional Czochr...
The homogeneity and luminescence properties of undoped bulk GaSb have been studied by the cathodolum...
Dilute Te-doped GaSb alloys have been prepared by the vertical feeding method (VFM) using both casti...
For the solidification process, the thermal factor, in particular, temperature gradients in solid an...
We présent in this paper a study by RHEED oscillations intensities of the growth of GaSb by M.B.E. F...