textabstractFor manufacturers of consumer electronics, conformance testing of embedded software is a vital issue. To improve performance, parts of this software are implemented in hardware, often designed in the Hardware Description Language VHDL. Conformance testing is a time consuming and error-prone process. Thus automating (parts of) this process is essential. There are many tools for test generation and for VHDL simulation. However, most test generation tools operate on a high level of abstraction and applying the generated tests to a VHDL design is a complicated task. For each specific case one can build a layer of dedicated circuitry and/or software that performs this task. It appears that the ad-hoc nature of this layer forms the bo...
The increasing use of high-level description languages, such as VHDL, to design large VLSI circuits ...
Functional testing of HDL specifications is one of the most promising approaches for the verificatio...
In this paper, we propose a new high-level test pattern generation technique for sequential circuits...
For manufacturers of consumer electronics, conformance testing of embedded software is a vital issue...
Colloque avec actes et comité de lecture. internationale.International audienceSome distributed syst...
The test problem increasingly affects system design process, related costs and time to market. Requi...
The ASICs in the automotive sensing area are greatly increasing in their complexity. Additional safe...
This paper describes, with examples, the use of advanced VHDL constructs that greatly enhance modeli...
Functional verification of an ASIC has become one of the most challenging tasks due to the increased...
International audienceWith the increasing probability of transient faults such as bit-flips due to S...
Verification of the functionality of VHDL specifications is one of the primary and most time consumi...
In this paper, we enrich VHDL with new specification constructs intended for hardware verification. ...
A guide to applying software design principles and coding practices to VHDL to improve the readabili...
Researchers have proposed different methods for testing digital logic circuits. The need for testing...
For high quality VLSI products, exhibiting very low escape rates, defect-oriented testing becomes ma...
The increasing use of high-level description languages, such as VHDL, to design large VLSI circuits ...
Functional testing of HDL specifications is one of the most promising approaches for the verificatio...
In this paper, we propose a new high-level test pattern generation technique for sequential circuits...
For manufacturers of consumer electronics, conformance testing of embedded software is a vital issue...
Colloque avec actes et comité de lecture. internationale.International audienceSome distributed syst...
The test problem increasingly affects system design process, related costs and time to market. Requi...
The ASICs in the automotive sensing area are greatly increasing in their complexity. Additional safe...
This paper describes, with examples, the use of advanced VHDL constructs that greatly enhance modeli...
Functional verification of an ASIC has become one of the most challenging tasks due to the increased...
International audienceWith the increasing probability of transient faults such as bit-flips due to S...
Verification of the functionality of VHDL specifications is one of the primary and most time consumi...
In this paper, we enrich VHDL with new specification constructs intended for hardware verification. ...
A guide to applying software design principles and coding practices to VHDL to improve the readabili...
Researchers have proposed different methods for testing digital logic circuits. The need for testing...
For high quality VLSI products, exhibiting very low escape rates, defect-oriented testing becomes ma...
The increasing use of high-level description languages, such as VHDL, to design large VLSI circuits ...
Functional testing of HDL specifications is one of the most promising approaches for the verificatio...
In this paper, we propose a new high-level test pattern generation technique for sequential circuits...