Single-molecule force spectroscopy studies performed by Atomic Force Microscopes (AFMs) strongly rely on accurately determined cantilever spring constants. Hence, to calibrate cantilevers, a reliable calibration protocol is essential. Although the thermal noise method and the direct Sader method are frequently used for cantilever calibration, there is no consensus on the optimal calibration of soft and V-shaped cantilevers, especially those used in force spectroscopy. Therefore, in this study we aimed at establishing a commonly accepted approach to accurately calibrate compliant and V-shaped cantilevers. In a round robin experiment involving eight different laboratories we compared the thermal noise and the Sader method on ten commercial an...
Dante J. (MEF Author)Ultra-short cantilevers are a new type of cantilever designed for the next gene...
The atomic force microscope (AFM) can provide qualitative information by numerous imaging modes, but...
[[abstract]]Atomic force microscopy (AFM) probe with different functions can be used to measure the ...
Single-molecule force spectroscopy studies performed by Atomic Force Microscopes (AFMs) strongly rel...
Item does not contain fulltextSingle-molecule force spectroscopy studies performed by Atomic Force M...
Measurement of force on a micro- or nano-Newton scale is important when exploring the mechanical pro...
Atomic force microscopy (AFM) employs microfabricated cantilevers as sensing elements, which are use...
The measurement of cantilever parameters is an essential part of performing a calibrated measurement...
<p>This research presents new calibration techniques for the characterization of atomic force micro...
International audienceThe use of atomic force microscopy in nanomechanical measurements requires acc...
The spring constant of an atomic force microscope cantilever is often needed for quantitative measur...
Several methods have been developed in recent years to calibrate the spring constant of atomic force...
This work presents a method for force calibration of rectangular atomic force microscopy (AFM) micro...
The scientific community needs a rapid and reliable way of accurately determining the stiffness of a...
A calibration method is presented for determining the spring constant of atomic force microscope (AF...
Dante J. (MEF Author)Ultra-short cantilevers are a new type of cantilever designed for the next gene...
The atomic force microscope (AFM) can provide qualitative information by numerous imaging modes, but...
[[abstract]]Atomic force microscopy (AFM) probe with different functions can be used to measure the ...
Single-molecule force spectroscopy studies performed by Atomic Force Microscopes (AFMs) strongly rel...
Item does not contain fulltextSingle-molecule force spectroscopy studies performed by Atomic Force M...
Measurement of force on a micro- or nano-Newton scale is important when exploring the mechanical pro...
Atomic force microscopy (AFM) employs microfabricated cantilevers as sensing elements, which are use...
The measurement of cantilever parameters is an essential part of performing a calibrated measurement...
<p>This research presents new calibration techniques for the characterization of atomic force micro...
International audienceThe use of atomic force microscopy in nanomechanical measurements requires acc...
The spring constant of an atomic force microscope cantilever is often needed for quantitative measur...
Several methods have been developed in recent years to calibrate the spring constant of atomic force...
This work presents a method for force calibration of rectangular atomic force microscopy (AFM) micro...
The scientific community needs a rapid and reliable way of accurately determining the stiffness of a...
A calibration method is presented for determining the spring constant of atomic force microscope (AF...
Dante J. (MEF Author)Ultra-short cantilevers are a new type of cantilever designed for the next gene...
The atomic force microscope (AFM) can provide qualitative information by numerous imaging modes, but...
[[abstract]]Atomic force microscopy (AFM) probe with different functions can be used to measure the ...