Add to ORKGAccelerated life tests were performed on CMOS microcircuits to predict their long term reliability. ...
Integrated circuits have evolved from early transistor technology as a result of the increasing reli...
Failure analysis test methods are presented for use in analyzing candidate electronic parts and in i...
Failure analyses on eleven microelectronic devices subjected to temperature-stress cycling, and life...
Tests of DTL NAND/NOR microcircuit gate configurations to determine effect of prolonged space enviro...
Failure mode determination for transistors - transient spike voltage, life test data on manufacturin...
Cyclic temperature and low temperature operating life tests, and pre-/post-life device evaluations w...
Destructive and nondestructive testing, results, and specifications for reliability of integrated ci...
Quality and reliability standard development and screening test results for MOS microelectronic devi...
Investigating categorization and formulation of stress and strength factors for semiconductor diodes...
Thermal fatigue life testing of various electronic packaging technologies is being performed by the ...
The applicability of Arrhenius and Eyring reaction rate models for describing microcircuit aging cha...
The cooperative agreement partly supported research leading to the open-literature publication cited...
New fundamental technique of reliability prediction for semiconductor diodes based on realistic math...
Microcircuit models and computer program for predicting failure modes under adverse environmental co...
Accelerated life tests were performed on CMOS microcircuits to predict their long term reliability. ...
Integrated circuits have evolved from early transistor technology as a result of the increasing reli...
Failure analysis test methods are presented for use in analyzing candidate electronic parts and in i...
Failure analyses on eleven microelectronic devices subjected to temperature-stress cycling, and life...
Tests of DTL NAND/NOR microcircuit gate configurations to determine effect of prolonged space enviro...
Failure mode determination for transistors - transient spike voltage, life test data on manufacturin...
Cyclic temperature and low temperature operating life tests, and pre-/post-life device evaluations w...
Destructive and nondestructive testing, results, and specifications for reliability of integrated ci...
Quality and reliability standard development and screening test results for MOS microelectronic devi...
Investigating categorization and formulation of stress and strength factors for semiconductor diodes...
Thermal fatigue life testing of various electronic packaging technologies is being performed by the ...
The applicability of Arrhenius and Eyring reaction rate models for describing microcircuit aging cha...
The cooperative agreement partly supported research leading to the open-literature publication cited...
New fundamental technique of reliability prediction for semiconductor diodes based on realistic math...
Microcircuit models and computer program for predicting failure modes under adverse environmental co...
Accelerated life tests were performed on CMOS microcircuits to predict their long term reliability. ...
Integrated circuits have evolved from early transistor technology as a result of the increasing reli...
Failure analysis test methods are presented for use in analyzing candidate electronic parts and in i...