Add to ORKGAbstract: This is a method and application note, in which we present one of our works on the charac...
AbstractGa+ Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM) have revolutionised the level o...
Three-dimensional information is much easier to understand than a set of two-dimensional images. The...
This article summarizes recent technological improvements of focused ion beam tomography. New in-len...
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA...
To study the fundamental effect of shape and morphology of any material on its properties, it is ver...
The Focused Ion Beam – Scanning Electron Microscope (FIB-SEM) is a versatile instrument originating ...
Over the past 15 years, with materials research moving into sub-micrometer-dimensions, focused ion b...
Focused ion beam nanotomography-scanning electron microscopy tomography yields high-quality three-di...
FIB/SEM tomography is a relatively new imaging technique for 3D investigation of biological tissue. ...
Focused ion beam (FIB) and scanning electron microscopy (SEM) became indispensable tools for materia...
In this paper the new term apparent beam size of Focused Ion Beam (FIB) is introduced and an origina...
Coupled dual-beam focused ion beam electron microscopy (FIB-EM) has gained popularity across multipl...
Since the end of the last millennium, the focused ion beam scanning electron microscopy (FIB-SEM) ha...
International audienceFocused ion beam nanotomography-scanning electron microscopy tomography yields...
Abstract: This is a method and application note, in which we present one of our works on the charac...
AbstractGa+ Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM) have revolutionised the level o...
Three-dimensional information is much easier to understand than a set of two-dimensional images. The...
This article summarizes recent technological improvements of focused ion beam tomography. New in-len...
Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA...
To study the fundamental effect of shape and morphology of any material on its properties, it is ver...
The Focused Ion Beam – Scanning Electron Microscope (FIB-SEM) is a versatile instrument originating ...
Over the past 15 years, with materials research moving into sub-micrometer-dimensions, focused ion b...
Focused ion beam nanotomography-scanning electron microscopy tomography yields high-quality three-di...
FIB/SEM tomography is a relatively new imaging technique for 3D investigation of biological tissue. ...
Focused ion beam (FIB) and scanning electron microscopy (SEM) became indispensable tools for materia...
In this paper the new term apparent beam size of Focused Ion Beam (FIB) is introduced and an origina...
Coupled dual-beam focused ion beam electron microscopy (FIB-EM) has gained popularity across multipl...
Since the end of the last millennium, the focused ion beam scanning electron microscopy (FIB-SEM) ha...
International audienceFocused ion beam nanotomography-scanning electron microscopy tomography yields...
Abstract: This is a method and application note, in which we present one of our works on the charac...
AbstractGa+ Focused Ion Beam-Scanning Electron Microscopes (FIB-SEM) have revolutionised the level o...
Three-dimensional information is much easier to understand than a set of two-dimensional images. The...