Add to ORKGPushing the resolution limits of the force microscope : from steps to atoms and atomic orbitals / F. J. Giessibl. – In: SPM : Proceedings of the Scanning Probe Microscopy-2003 (SPM-2003) Workshop. - Moscow : VSV, 2003. – S. 172-174. – (Physics of low-dimensional structures ; 2003,3/4
In a Scanning Tunneling Microscope [1], an electronic current flows through the tunneling barrier be...
Progress in nanoscience and nanotechnology requires tools that enable the imaging and manipulation o...
This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its ...
Pushing the resolution limits of the force microscope : from steps to atoms and atomic orbitals / F....
Force microscopy in vacuum with atomic resolution / F. J. Giessibl. – In: Preliminary proceedings of...
Principle of high-resolution atomic force microscopy / F. J. Giessibl. – In: Fundamentals of nanoele...
We review progress in improving the spatial resolution of atomic force microscopy (AFM) under vacuum...
Atomic force microscopy (AFM) is a technique wherein an atomically sharp needle raster scans across ...
It's hard to imagine that we can take a splinter and sharpen it down to the atomic level. It's even ...
Since it was invented by Binnig et al in 1986, atomic force microscopy (AFM) has played a crucial ro...
The scan probe microscopy (SPM), a technology based on the scan tunneling microscope (STM), the atom...
The essence of the work presented here is the introduction, the advance in theoretical understanding...
Atomic force microscopy on its way to adolescence / F. J. Giessibl. – In: Scanning tunneling microsc...
This book presents the latest developments in noncontact atomic force microscopy. It deals with the ...
Abstract. We review the results of theoretical modelling of scanning force microscopy and discuss th...
In a Scanning Tunneling Microscope [1], an electronic current flows through the tunneling barrier be...
Progress in nanoscience and nanotechnology requires tools that enable the imaging and manipulation o...
This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its ...
Pushing the resolution limits of the force microscope : from steps to atoms and atomic orbitals / F....
Force microscopy in vacuum with atomic resolution / F. J. Giessibl. – In: Preliminary proceedings of...
Principle of high-resolution atomic force microscopy / F. J. Giessibl. – In: Fundamentals of nanoele...
We review progress in improving the spatial resolution of atomic force microscopy (AFM) under vacuum...
Atomic force microscopy (AFM) is a technique wherein an atomically sharp needle raster scans across ...
It's hard to imagine that we can take a splinter and sharpen it down to the atomic level. It's even ...
Since it was invented by Binnig et al in 1986, atomic force microscopy (AFM) has played a crucial ro...
The scan probe microscopy (SPM), a technology based on the scan tunneling microscope (STM), the atom...
The essence of the work presented here is the introduction, the advance in theoretical understanding...
Atomic force microscopy on its way to adolescence / F. J. Giessibl. – In: Scanning tunneling microsc...
This book presents the latest developments in noncontact atomic force microscopy. It deals with the ...
Abstract. We review the results of theoretical modelling of scanning force microscopy and discuss th...
In a Scanning Tunneling Microscope [1], an electronic current flows through the tunneling barrier be...
Progress in nanoscience and nanotechnology requires tools that enable the imaging and manipulation o...
This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its ...