Add to ORKGSingle-event effect (SEE) test data is presented on the Analog Devices ADV212. Focus is given to the test setup used to improve data quality and validate single-event latchup (SEL) protection circuitry
In the technologic era in which we are living, reliability is a crucial aspect in every technology a...
The single event effects or phenomena (SEP), which so far have been observed as events falling on on...
Abstract A pulsed nanosecond IR laser diode system to automatically test the Single Event Effects ...
Single-event effect (SEE) test data is presented on the Analog Devices ADV212. Focus is given to the...
From previous SEE testing on the RT6804-11, a soft latch-up condition was identified with this devic...
This viewgraph presentation reviews the testing of the Texas Instrument Digital Signal Processor(TI-...
In space, the radiation effects on electronic devices may lead to anomalies referred to as Single-Ev...
Single event effect data is presented on the Analog Devices AD7984. The recent heavy-ion test result...
Radiation encountered in space environments can be damaging to microelectronics and potentially caus...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
We conducted 47 exposures of four different MIC4424 devices and did not observe any SEL or high-curr...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
The focus of this thesis is single event effects in electronic circuits, and mainly single event lat...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
The importance of Cosmic Rays on the performance of integrated circuits (IC's) in a space environmen...
In the technologic era in which we are living, reliability is a crucial aspect in every technology a...
The single event effects or phenomena (SEP), which so far have been observed as events falling on on...
Abstract A pulsed nanosecond IR laser diode system to automatically test the Single Event Effects ...
Single-event effect (SEE) test data is presented on the Analog Devices ADV212. Focus is given to the...
From previous SEE testing on the RT6804-11, a soft latch-up condition was identified with this devic...
This viewgraph presentation reviews the testing of the Texas Instrument Digital Signal Processor(TI-...
In space, the radiation effects on electronic devices may lead to anomalies referred to as Single-Ev...
Single event effect data is presented on the Analog Devices AD7984. The recent heavy-ion test result...
Radiation encountered in space environments can be damaging to microelectronics and potentially caus...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
We conducted 47 exposures of four different MIC4424 devices and did not observe any SEL or high-curr...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
The focus of this thesis is single event effects in electronic circuits, and mainly single event lat...
We present the results of single event effects (SEE) testing and analysis investigating the effects ...
The importance of Cosmic Rays on the performance of integrated circuits (IC's) in a space environmen...
In the technologic era in which we are living, reliability is a crucial aspect in every technology a...
The single event effects or phenomena (SEP), which so far have been observed as events falling on on...
Abstract A pulsed nanosecond IR laser diode system to automatically test the Single Event Effects ...