Effect of silicon atomic force microscope probe position and particle spacing on the local absorption of an array of gold nanoparticles placed over a dielectric borosilicate glass surface are evaluated. An improved, vectorized version of discrete dipole approximation coupled with surface interactions is employed throughout the study. It is shown that surface evanescent waves interacting with the system of nanoparticles and atomic force microscope probe result in a near-field coupling between them. This coupling can enhance or reduce the local absorption by the nanoparticles depending on the position of atomic force microscope tip in three-dimensional space and direction of propagation of the surface evanescent wave. The position of the atom...
Atomic force microscopy (AFM) and dielectrophoresis (DEP) technologies have been used as excellent t...
Department of Physics, Banwarilal Bhalotia College, Asansol-713 303, West Bengal, India E-mail: devm...
We demonstrate the far field detection of low-contrast nanoparticles on surfaces using a technique t...
This study considers enhancing localized absorption by a gold nanoparticle (NP) placed over a substr...
Due to copyright restrictions, the access to the full text of this article is only available via sub...
Precise positioning of a plasmonic nanoparticle (NP) near a small dielectric surface is not only nec...
The interaction of an evanescent wave and plasmonic nanostructures are simulated in Finite Element M...
Motivated by the need for a modeling tool for nanostructures interacting with a substrate and an AFM...
In this thesis work the atomic force microscope (AFM) was employed first as a high precision manipul...
[[abstract]]High local-field enhancement appears in the vicinity of the surface of metallic nanostru...
In this article, we present a novel method of spatial manipulation and assembly of nanoparticles via...
International audienceUsing an apertureless scanning near-field optical microscope, we obtained wave...
We investigate the influence of an air-dielectric interface on evanescent field vector detections us...
Interactions at the nanoscale are governed almost exclusively by electromagnetic forces, but the int...
Due to copyright restrictions, the access to the full text of this article is only available via sub...
Atomic force microscopy (AFM) and dielectrophoresis (DEP) technologies have been used as excellent t...
Department of Physics, Banwarilal Bhalotia College, Asansol-713 303, West Bengal, India E-mail: devm...
We demonstrate the far field detection of low-contrast nanoparticles on surfaces using a technique t...
This study considers enhancing localized absorption by a gold nanoparticle (NP) placed over a substr...
Due to copyright restrictions, the access to the full text of this article is only available via sub...
Precise positioning of a plasmonic nanoparticle (NP) near a small dielectric surface is not only nec...
The interaction of an evanescent wave and plasmonic nanostructures are simulated in Finite Element M...
Motivated by the need for a modeling tool for nanostructures interacting with a substrate and an AFM...
In this thesis work the atomic force microscope (AFM) was employed first as a high precision manipul...
[[abstract]]High local-field enhancement appears in the vicinity of the surface of metallic nanostru...
In this article, we present a novel method of spatial manipulation and assembly of nanoparticles via...
International audienceUsing an apertureless scanning near-field optical microscope, we obtained wave...
We investigate the influence of an air-dielectric interface on evanescent field vector detections us...
Interactions at the nanoscale are governed almost exclusively by electromagnetic forces, but the int...
Due to copyright restrictions, the access to the full text of this article is only available via sub...
Atomic force microscopy (AFM) and dielectrophoresis (DEP) technologies have been used as excellent t...
Department of Physics, Banwarilal Bhalotia College, Asansol-713 303, West Bengal, India E-mail: devm...
We demonstrate the far field detection of low-contrast nanoparticles on surfaces using a technique t...