In this letter, we propose an effective route to reduce the cell-to-cell variability in 1T-1R-based random access memories (RRAM) arrays by combining the excellent switching performance of Hf1-xAlxOy with an optimized incremental step pulse with verify algorithm for programming. The strongly reduced cell-to-cell variability improves the thermal and post-programming stability of the arrays, which is relevant for many applications of the RRAM technology. Finally, the retention study at 150 °C enables the prediction of the data storage capability
Resistive random access memory (RRAM) is a promising candidate for the next-generation non-volatile ...
The intercell variability of the initial state and the impact of dc and pulse forming on intercell v...
The impact of temperature during the forming operation on the electrical cells performance and the p...
A crucial step in order to achieve fast and low-energy switching operations in resistive random acce...
In this work, cells behavior during forming is monitored through an incremental pulse and verify alg...
Producción CientíficaA crucial step in order to achieve fast and low-energy switching operations in ...
Current state-of-the-art memory technologies such as FLASH, Static Random Access Memory (SRAM) and D...
Achieving a reliable multi-level operation in resistive random access memory (RRAM) arrays is curren...
The Resistive RAM (RRAM) technology is currently in a level of maturity that calls for its integrati...
The Resistive RAM (RRAM) technology is currently in a level of maturity that calls for its integrati...
In this work, a comparison between 1T-1R RRAM 4kbits arrays manufactured either with amorphous or po...
© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
In this work, a comparison between 1T-1R RRAM arrays, manufactured either with amorphous or poly-cry...
The forming process, which corresponds to the activation of the switching filament in Resistive Rand...
We optimize and investigate extensively the sub-μA bipolar operation of scaled Al2O3- and HfO2-based...
Resistive random access memory (RRAM) is a promising candidate for the next-generation non-volatile ...
The intercell variability of the initial state and the impact of dc and pulse forming on intercell v...
The impact of temperature during the forming operation on the electrical cells performance and the p...
A crucial step in order to achieve fast and low-energy switching operations in resistive random acce...
In this work, cells behavior during forming is monitored through an incremental pulse and verify alg...
Producción CientíficaA crucial step in order to achieve fast and low-energy switching operations in ...
Current state-of-the-art memory technologies such as FLASH, Static Random Access Memory (SRAM) and D...
Achieving a reliable multi-level operation in resistive random access memory (RRAM) arrays is curren...
The Resistive RAM (RRAM) technology is currently in a level of maturity that calls for its integrati...
The Resistive RAM (RRAM) technology is currently in a level of maturity that calls for its integrati...
In this work, a comparison between 1T-1R RRAM 4kbits arrays manufactured either with amorphous or po...
© 2017 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
In this work, a comparison between 1T-1R RRAM arrays, manufactured either with amorphous or poly-cry...
The forming process, which corresponds to the activation of the switching filament in Resistive Rand...
We optimize and investigate extensively the sub-μA bipolar operation of scaled Al2O3- and HfO2-based...
Resistive random access memory (RRAM) is a promising candidate for the next-generation non-volatile ...
The intercell variability of the initial state and the impact of dc and pulse forming on intercell v...
The impact of temperature during the forming operation on the electrical cells performance and the p...