Targeting SRAM FPGA Components Using a Two-Photon Absorption Laser

State-of-the-art SRAM FPGAs (Field Programmable Gate Arrays) are being increasingly considered for use in space applications, due to their reprogrammability and many dedicated resources that implement many common tasks at high speeds. However, the programmable fabric and resources are susceptible to ionizing radiation common in space, causing the device to fail. The radiation effects of all the components need to be known in order to develop effective mitigation techniques. This information, however, is difficult to obtain through typical broadbeam ion testing, due to low observability rates of the components. This paper present the results of a study to use a laser to study the radiation effects on a FPGA. Specifically, three studies were conducted to show the necessity of laser calibration as well as a case study using this calibration to test a specific component on the FPGA. This calibration technique will be used in the future to test many more components on the FPGA