Neutron reflectometry can determine unambiguously the chemical depth profile of a thin film if both phase and amplitude of the reflectance are known. The recovery of the phase information is achieved by adding to the unknown layered structure a known ferromagnetic layer. The ferromagnetic layer is magnetized by an external magnetic field in a direction lying in the plane of the layer and subsequently perpendicular to it. The neutrons are polarized either parallel or opposite to the magnetic field. In this way three measurements can be made, with different (and known) scattering-length densities of the ferromagnetic layer. The reflectivity obtained from each measurement can be represented by a circle in the (complex) reflectance plane. The i...
It is shown that the analysis of surface layers by neutron reflection interferometry is considerabl...
A recent paper by D.S. Sivia and R. Pynn (SPIE Conf. Proc., Vol. 1738, 1992) has shown theoretically...
It is shown that the analysis of surface layers by neutron reflection interferometry is considerabl...
Neutron reflectometry can determine unambiguously the chemical depth profile of a thin film if both ...
Neutron reflectometry can determine unambiguously the chemical depth profile of a thin film if both ...
Neutron reflectometry can determine unambiguously the chemical depth profile of a thin film if both ...
The authors show that the chemical depth profile of a film of unknown structure can be retrieved una...
A method is proposed to determine the complex reflection coefficient of any real scattering length ...
Polarized-neutron specular reflectometry (PNR) was developed in the 1980's as a means of measuring m...
The specular neutron reflectivity is a technique enabling the measurement of neutron scattering leng...
In the past decades, neutron reflectometry have flourished as an applicable method to the study of t...
Neutron reflectometry is an important technique for studying the composition and structure of thin f...
We describe a novel method for phase recovery in neutron reflectometry which is based on using Gd re...
Specular neutron reflectometry has become an established probe of the nanometer scale structure of m...
It is shown that the analysis of surface layers by neutron reflection interferometry is considerabl...
It is shown that the analysis of surface layers by neutron reflection interferometry is considerabl...
A recent paper by D.S. Sivia and R. Pynn (SPIE Conf. Proc., Vol. 1738, 1992) has shown theoretically...
It is shown that the analysis of surface layers by neutron reflection interferometry is considerabl...
Neutron reflectometry can determine unambiguously the chemical depth profile of a thin film if both ...
Neutron reflectometry can determine unambiguously the chemical depth profile of a thin film if both ...
Neutron reflectometry can determine unambiguously the chemical depth profile of a thin film if both ...
The authors show that the chemical depth profile of a film of unknown structure can be retrieved una...
A method is proposed to determine the complex reflection coefficient of any real scattering length ...
Polarized-neutron specular reflectometry (PNR) was developed in the 1980's as a means of measuring m...
The specular neutron reflectivity is a technique enabling the measurement of neutron scattering leng...
In the past decades, neutron reflectometry have flourished as an applicable method to the study of t...
Neutron reflectometry is an important technique for studying the composition and structure of thin f...
We describe a novel method for phase recovery in neutron reflectometry which is based on using Gd re...
Specular neutron reflectometry has become an established probe of the nanometer scale structure of m...
It is shown that the analysis of surface layers by neutron reflection interferometry is considerabl...
It is shown that the analysis of surface layers by neutron reflection interferometry is considerabl...
A recent paper by D.S. Sivia and R. Pynn (SPIE Conf. Proc., Vol. 1738, 1992) has shown theoretically...
It is shown that the analysis of surface layers by neutron reflection interferometry is considerabl...