Incomplete ionization is an important issue when modeling silicon devices featuring aluminum-doped p+ (Al-p+) regions. Aluminum has a rather deep state in the band gap compared to boron or phosphorus, causing strong incomplete ionization. In this paper, we considerably improve our recent parameterization [Steinkemper et al., J. Appl. Phys. 117, 074504 (2015)]. On the one hand, we found a fundamental criterion to further reduce the number of free parameters in our fitting procedure. And on the other hand, we address a mistake in the original publication of the incomplete ionization formalism in Altermatt et al., J. Appl. Phys. 100, 113715 (2006)
International audienceThis paper investigates the importance of incomplete ionization of dopants in ...
International audienceIn this paper, we show through both calculations and Hall effect measurements ...
In this paper we present a new update to PC1Dmod, which extends the original PC1D program by impleme...
In this study we present an advanced method for precise modeling of highly aluminum-doped p+ silicon...
We present a detailed study on accurate modeling of highly aluminum-doped p+ silicon. We have analyz...
AbstractWe present a detailed study on accurate modeling of highly aluminum-doped p+ silicon. We hav...
We present a detailed study on incomplete ionization (i.i.) of aluminum acceptors in highly aluminum...
AbstractWe present a detailed study on accurate modeling of highly aluminum-doped p+ silicon. We hav...
A parametrization of the density of states (DOS) near the band edge of phosphorus-doped crystalline ...
The ionization of impurity atoms is an important process in determining the number of free carriers,...
The ionization of impurity atoms is an important process in determining the number of free carriers,...
Building on Part I of this paper [Altermatt , J. Appl. Phys. 100, 113714 (2006)], the parametrizatio...
Since CMOS (Complementary metal-oxide-semiconductor) circuits were invented in 1963, CMOS technology...
Since CMOS (Complementary metal-oxide-semiconductor) circuits were invented in 1963, CMOS technology...
In this paper, we show through both calculations and Hall effect measurements that incomplete ioniza...
International audienceThis paper investigates the importance of incomplete ionization of dopants in ...
International audienceIn this paper, we show through both calculations and Hall effect measurements ...
In this paper we present a new update to PC1Dmod, which extends the original PC1D program by impleme...
In this study we present an advanced method for precise modeling of highly aluminum-doped p+ silicon...
We present a detailed study on accurate modeling of highly aluminum-doped p+ silicon. We have analyz...
AbstractWe present a detailed study on accurate modeling of highly aluminum-doped p+ silicon. We hav...
We present a detailed study on incomplete ionization (i.i.) of aluminum acceptors in highly aluminum...
AbstractWe present a detailed study on accurate modeling of highly aluminum-doped p+ silicon. We hav...
A parametrization of the density of states (DOS) near the band edge of phosphorus-doped crystalline ...
The ionization of impurity atoms is an important process in determining the number of free carriers,...
The ionization of impurity atoms is an important process in determining the number of free carriers,...
Building on Part I of this paper [Altermatt , J. Appl. Phys. 100, 113714 (2006)], the parametrizatio...
Since CMOS (Complementary metal-oxide-semiconductor) circuits were invented in 1963, CMOS technology...
Since CMOS (Complementary metal-oxide-semiconductor) circuits were invented in 1963, CMOS technology...
In this paper, we show through both calculations and Hall effect measurements that incomplete ioniza...
International audienceThis paper investigates the importance of incomplete ionization of dopants in ...
International audienceIn this paper, we show through both calculations and Hall effect measurements ...
In this paper we present a new update to PC1Dmod, which extends the original PC1D program by impleme...