Devices and methods to test high speed analog-to-digital and digital-to-analog signal converters are provided. According to one embodiment, a testing device can comprise an output, a mixer, and an input. The output can provide a signal, and the mixer can receive the signal and provide a test signal to a data converter having a sampling frequency. The test signal can be spectrally impure. The input can sample the data converter output at a frequency less the sampling frequency so that the data converter output is under sampled. According to another embodiment, a first set of data converters are tested to obtain a mapping function that relates dynamic specifications to device signatures. Then a second set of data converters can be tested and ...
A new method is presented to test dynamic parameters of Analogue-to-Digital Converters (ADC). A nois...
The dynamic characterization of digital to analog converters (DACs) is still an open issue, on whose...
Signals found in nature need to be converted to the digital domain through analog-to-digital convert...
Converter testing is a complex process. Test specifications are application dependent and in most ca...
An apparatus for measuring a high speed signal may comprise a plurality of Analog-Digital converters...
In this paper, new state of the art analog-to-digital converters (ADCs) testing techniques both stat...
Analog-to-digital and digital-to-analog converters are important building blocks connecting the anal...
The system described in this thesis was developed as part of a larger effort to design a high-perfor...
Modern day dynamic specification testing of high-resolution mixed-signal devices, such as the ΣΔ ana...
SIGLELD:D49447/84 / BLDSC - British Library Document Supply CentreGBUnited Kingdo
As technological progress leads to increasing data transmission rates, use of digital transmission i...
The recent research on metrological testing of analog-to-digital converter-based measuring devices i...
Summary – This paper presents a system named ADC TEST that estimates the static and dynamic paramete...
Mixed-signal System-on-chip devices such as analog-to-digital converters (ADCs) have become increasi...
The advent of deep submicron technology has resulted in a new generation of highly integrated mixed-...
A new method is presented to test dynamic parameters of Analogue-to-Digital Converters (ADC). A nois...
The dynamic characterization of digital to analog converters (DACs) is still an open issue, on whose...
Signals found in nature need to be converted to the digital domain through analog-to-digital convert...
Converter testing is a complex process. Test specifications are application dependent and in most ca...
An apparatus for measuring a high speed signal may comprise a plurality of Analog-Digital converters...
In this paper, new state of the art analog-to-digital converters (ADCs) testing techniques both stat...
Analog-to-digital and digital-to-analog converters are important building blocks connecting the anal...
The system described in this thesis was developed as part of a larger effort to design a high-perfor...
Modern day dynamic specification testing of high-resolution mixed-signal devices, such as the ΣΔ ana...
SIGLELD:D49447/84 / BLDSC - British Library Document Supply CentreGBUnited Kingdo
As technological progress leads to increasing data transmission rates, use of digital transmission i...
The recent research on metrological testing of analog-to-digital converter-based measuring devices i...
Summary – This paper presents a system named ADC TEST that estimates the static and dynamic paramete...
Mixed-signal System-on-chip devices such as analog-to-digital converters (ADCs) have become increasi...
The advent of deep submicron technology has resulted in a new generation of highly integrated mixed-...
A new method is presented to test dynamic parameters of Analogue-to-Digital Converters (ADC). A nois...
The dynamic characterization of digital to analog converters (DACs) is still an open issue, on whose...
Signals found in nature need to be converted to the digital domain through analog-to-digital convert...