The electrical behaviour of Schottky barrier diodes realized on vertically standing individual GaN nanorods and array of nanorods is investigated. The Schottky diodes on individual nanorod show highest barrier height in comparison with large area diodes on nanorods array and epitaxial film which is in contrast with previously published work. The discrepancy between the electrical behaviour of nanoscale Schottky diodes and large area diodes is explained using cathodoluminescence measurements, surface potential analysis using Kelvin probe force microscopy and 1ow frequency noise measurements. The noise measurements on large area diodes on nanorods array and epitaxial film suggest the presence of barrier inhomogeneities at the metal/semiconduc...
The impact of threading dislocation density on Ni/n-GaN Schottky barrier diode characteristics is in...
We have measured the intrinsic Schottky barrier height of Au/n-GaNAu/n-GaN metal–semiconductor diode...
International audienceThis paper proposes an investigation focused on the Schottky Diode related ele...
The electrical behaviour of Schottky barrier diodes realized on vertically standing individual GaN n...
In this paper, the electrical behavior of a Ni/Au Schottky barrier on free standing GaN has been stu...
Conductive atomic force microscopy has been used to characterize single GaN nanorod ...
In this paper, the electrical behavior of a Ni/Au Schottky barrier on free standing GaN has been stu...
In this paper, the electrical behavior of a Ni/Au Schottky barrier on free standing GaN has been stu...
International audienceThis paper reports comprehensive characterization of vertical GaN-on-GaN Schot...
International audienceThis paper reports comprehensive characterization of vertical GaN-on-GaN Schot...
International audienceThis paper reports comprehensive characterization of vertical GaN-on-GaN Schot...
We investigate the electrical characteristics of Schottky contacts for an Au/hydride vapor phase epi...
Current-voltage (I-V) measurements combined with analytical calculations have been used to explain m...
Current-voltage (I-V) measurements combined with analytical calculations have been used to explain m...
Current-voltage (I-V) measurements combined with analytical calculations have been used to explain m...
The impact of threading dislocation density on Ni/n-GaN Schottky barrier diode characteristics is in...
We have measured the intrinsic Schottky barrier height of Au/n-GaNAu/n-GaN metal–semiconductor diode...
International audienceThis paper proposes an investigation focused on the Schottky Diode related ele...
The electrical behaviour of Schottky barrier diodes realized on vertically standing individual GaN n...
In this paper, the electrical behavior of a Ni/Au Schottky barrier on free standing GaN has been stu...
Conductive atomic force microscopy has been used to characterize single GaN nanorod ...
In this paper, the electrical behavior of a Ni/Au Schottky barrier on free standing GaN has been stu...
In this paper, the electrical behavior of a Ni/Au Schottky barrier on free standing GaN has been stu...
International audienceThis paper reports comprehensive characterization of vertical GaN-on-GaN Schot...
International audienceThis paper reports comprehensive characterization of vertical GaN-on-GaN Schot...
International audienceThis paper reports comprehensive characterization of vertical GaN-on-GaN Schot...
We investigate the electrical characteristics of Schottky contacts for an Au/hydride vapor phase epi...
Current-voltage (I-V) measurements combined with analytical calculations have been used to explain m...
Current-voltage (I-V) measurements combined with analytical calculations have been used to explain m...
Current-voltage (I-V) measurements combined with analytical calculations have been used to explain m...
The impact of threading dislocation density on Ni/n-GaN Schottky barrier diode characteristics is in...
We have measured the intrinsic Schottky barrier height of Au/n-GaNAu/n-GaN metal–semiconductor diode...
International audienceThis paper proposes an investigation focused on the Schottky Diode related ele...