Scan Performance of Infinite Arrays of Microstrip Patch Elements Loaded with Varactor Diodes

In this paper the analysis and scanning characteristics of an infinite array of rectangular microstrip patches each loaded with a varactor diode is presented. The analysis is based on full-wave moment method theory and uses attachment modes to accurately model the current through the feed and the diode. The effect of the biased varactor diode on the scan performance is presented, and it is shown that the impedance mismatch caused by a scan blindness can be eliminated. Other characteristics are also given such as: the active element gain, the efficiency of each loaded microstrip element, and the level of cross polarization generated by the loading of the patch. The effect of the diode biasing level as well as the position of the diode on each radiating element on these scan characteristics is also considered