Add to ORKGModern chips may contain a large number of embedded test, debug, configuration, and monitoring features, called instruments. An instrument and its instrument data, instrument access procedures, may be pre-developed and reused and instruments may be accessed in different ways through the life-time of the chip, which requires retargeting. To address instruments reuse and retargeting, IEEE P1678 specifies a hardware architecture, a hardware description language, and an access procedure description language. In this paper, we investigate how P1687 facilitates instrument access procedure reuse and retargeting
Embedded instruments are becoming used more often in modern SoCs for different testing and measureme...
IEEE 1687 enables flexible access to on-chip instruments via dynamically reconfigurable networks. Re...
To facilitate smooth VLSI development and improve chip dependability, VLSI designs incorporate instr...
Modern chips may contain a large number of embedded test, debugging, configuration, and monitoring f...
IEEE 1687 (iJTAG) standard introduces a methodology for accessing the increasing number of embedded ...
The constant need for higher performance and more advanced functionality has made the design and man...
The ever-increasing need for higher performance and more complex functionality pushes the electronic...
Accessing embedded test and monitoring circuitry (the so-called embedded instruments) in in-field pr...
The IEEE P1687 (IJTAG) standard proposal aimsat standardizing the access to embedded test and debug ...
As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become har...
The continuous development in silicon manufacturing technologies and the increased reliance on desig...
The IEEE Std. P1687.1 working group is currently exploring alternatives to IEEE Std. 1149.1 test acc...
Modern integrated circuits (ICs) contain thousands of instruments to enable testing, tuning, monitor...
While the advancement in semiconductor technologies enables manufacturing of highly advanced and com...
As the complexity of VLSI designs grows, the amount of embedded instrumentation in system-on-a-chip ...
Embedded instruments are becoming used more often in modern SoCs for different testing and measureme...
IEEE 1687 enables flexible access to on-chip instruments via dynamically reconfigurable networks. Re...
To facilitate smooth VLSI development and improve chip dependability, VLSI designs incorporate instr...
Modern chips may contain a large number of embedded test, debugging, configuration, and monitoring f...
IEEE 1687 (iJTAG) standard introduces a methodology for accessing the increasing number of embedded ...
The constant need for higher performance and more advanced functionality has made the design and man...
The ever-increasing need for higher performance and more complex functionality pushes the electronic...
Accessing embedded test and monitoring circuitry (the so-called embedded instruments) in in-field pr...
The IEEE P1687 (IJTAG) standard proposal aimsat standardizing the access to embedded test and debug ...
As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become har...
The continuous development in silicon manufacturing technologies and the increased reliance on desig...
The IEEE Std. P1687.1 working group is currently exploring alternatives to IEEE Std. 1149.1 test acc...
Modern integrated circuits (ICs) contain thousands of instruments to enable testing, tuning, monitor...
While the advancement in semiconductor technologies enables manufacturing of highly advanced and com...
As the complexity of VLSI designs grows, the amount of embedded instrumentation in system-on-a-chip ...
Embedded instruments are becoming used more often in modern SoCs for different testing and measureme...
IEEE 1687 enables flexible access to on-chip instruments via dynamically reconfigurable networks. Re...
To facilitate smooth VLSI development and improve chip dependability, VLSI designs incorporate instr...