Modern chips may contain a large number of embedded test, debugging, configuration, and monitoring features, called instruments. An instrument and its instrument access procedures may be pre-developed and reused, and each instrument—in different chips and through the life-time of a chip—may be accessed in different ways, which requires retargeting. To address reuse and retargeting of instrument access procedures, IEEE P1678 specifies a hardware architecture, a hardware description language, and an access procedure description language. In this paper, we investigate how P1687 facilitates instrument access procedure reuse and retargeting
The IEEE Std. P1687.1 is exploring alternatives to IEEE Std. 1149.1 test access port for accessing I...
IEEE 1687 enables flexible access to the embedded (on-chip) instruments that are needed for post-sil...
While the advancement in semiconductor technologies enables manufacturing of highly advanced and com...
Modern chips may contain a large number of embedded test, debug, configuration, and monitoring featu...
This paper discusses the reuse and retargeting of test instruments and test patterns using the IEEE ...
IEEE 1687 (iJTAG) standard introduces a methodology for accessing the increasing number of embedded ...
The constant need for higher performance and more advanced functionality has made the design and man...
The ever-increasing need for higher performance and more complex functionality pushes the electronic...
As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become har...
Modern integrated circuits (ICs) contain thousands of instruments to enable testing, tuning, monitor...
The continuous development in silicon manufacturing technologies and the increased reliance on desig...
Accessing embedded test and monitoring circuitry (the so-called embedded instruments) in in-field pr...
The IEEE Std. P1687.1 working group is currently exploring alternatives to IEEE Std. 1149.1 test acc...
The IEEE P1687 (IJTAG) standard proposal aimsat standardizing the access to embedded test and debug ...
As the complexity of VLSI designs grows, the amount of embedded instrumentation in system-on-a-chip ...
The IEEE Std. P1687.1 is exploring alternatives to IEEE Std. 1149.1 test access port for accessing I...
IEEE 1687 enables flexible access to the embedded (on-chip) instruments that are needed for post-sil...
While the advancement in semiconductor technologies enables manufacturing of highly advanced and com...
Modern chips may contain a large number of embedded test, debug, configuration, and monitoring featu...
This paper discusses the reuse and retargeting of test instruments and test patterns using the IEEE ...
IEEE 1687 (iJTAG) standard introduces a methodology for accessing the increasing number of embedded ...
The constant need for higher performance and more advanced functionality has made the design and man...
The ever-increasing need for higher performance and more complex functionality pushes the electronic...
As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become har...
Modern integrated circuits (ICs) contain thousands of instruments to enable testing, tuning, monitor...
The continuous development in silicon manufacturing technologies and the increased reliance on desig...
Accessing embedded test and monitoring circuitry (the so-called embedded instruments) in in-field pr...
The IEEE Std. P1687.1 working group is currently exploring alternatives to IEEE Std. 1149.1 test acc...
The IEEE P1687 (IJTAG) standard proposal aimsat standardizing the access to embedded test and debug ...
As the complexity of VLSI designs grows, the amount of embedded instrumentation in system-on-a-chip ...
The IEEE Std. P1687.1 is exploring alternatives to IEEE Std. 1149.1 test access port for accessing I...
IEEE 1687 enables flexible access to the embedded (on-chip) instruments that are needed for post-sil...
While the advancement in semiconductor technologies enables manufacturing of highly advanced and com...