Different types of optical light guides were constructed and tested to enable convenient multiple angle of incidence ellipsometry, on solid and liquid interfaces in liquid solutions. Two light guides are needed on an ellipsometer, one to guide the incoming light and one to guide the light that is reflected at the test surface, and therefore one light guide was mounted on the laser arm and one on the detector arm of the ellipsometer. With this arrangement the optical windows automatically adjust to always be perpendicular to the direction of the light independent of the angle of incidence. The purpose with these light guides is to facilitate the passage of light through the air/solution interface. A thorough theoretical and experimental anal...
Two distinct and general definitions of ellipsometry and polarimetry are stated ab initio that accou...
Sensitivity and precision have been and continue to be considerations which have contributed to the ...
Two main subjects, ellipsometry and computer screen photo-assisted techniques (CSPT), form the main ...
Ellipsometric microscopy is a technique for simultaneous measurement of thin film thickness and inde...
An innovative ellipsometer sample holder has been designed and tested in order to measure thin films...
Adsorption of several surface active agents, such as nonionics, diblock copolymers, triblock copolym...
Measurements of optical properties provide insight into how materials interact with electromagnetic ...
An innovative ellipsometer sample holder has been designed and tested in order to measure thin films...
Ellipsometry is an optical method used for characterizing materials and thin films. The principle is...
Spectroscopic ellipsometry is a sensitive and optical model-supported quantitative tool to monitor i...
Surface Second Harmonic Generation (SHG) and ellipsometry have been combined to give Second Harmonic...
This report investigates the parameters affecting the output light intensity given a fixed input lig...
The index of refraction is a material property that determines the speed of light propagating throug...
[[abstract]]Coating technology has played an important role in optics, opto-electronics, semiconduct...
This paper describes the use of ellipsometry as a precise and accurate technique for characterizing ...
Two distinct and general definitions of ellipsometry and polarimetry are stated ab initio that accou...
Sensitivity and precision have been and continue to be considerations which have contributed to the ...
Two main subjects, ellipsometry and computer screen photo-assisted techniques (CSPT), form the main ...
Ellipsometric microscopy is a technique for simultaneous measurement of thin film thickness and inde...
An innovative ellipsometer sample holder has been designed and tested in order to measure thin films...
Adsorption of several surface active agents, such as nonionics, diblock copolymers, triblock copolym...
Measurements of optical properties provide insight into how materials interact with electromagnetic ...
An innovative ellipsometer sample holder has been designed and tested in order to measure thin films...
Ellipsometry is an optical method used for characterizing materials and thin films. The principle is...
Spectroscopic ellipsometry is a sensitive and optical model-supported quantitative tool to monitor i...
Surface Second Harmonic Generation (SHG) and ellipsometry have been combined to give Second Harmonic...
This report investigates the parameters affecting the output light intensity given a fixed input lig...
The index of refraction is a material property that determines the speed of light propagating throug...
[[abstract]]Coating technology has played an important role in optics, opto-electronics, semiconduct...
This paper describes the use of ellipsometry as a precise and accurate technique for characterizing ...
Two distinct and general definitions of ellipsometry and polarimetry are stated ab initio that accou...
Sensitivity and precision have been and continue to be considerations which have contributed to the ...
Two main subjects, ellipsometry and computer screen photo-assisted techniques (CSPT), form the main ...