X-ray diffuse scattering measurements of nucleation dynamics at femtosecond resolution
- Lindenberg, A. M.
- Engemann, S.
- Gaffney, K. J.
- Sokolowski-Tinten, K.
- Larsson, Jörgen
- Hillyard, P. B.
- Reis, D. A.
- Fritz, D. M.
- Arthur, J.
- Akre, R. A.
- George, M. J.
- Deb, A.
- Bucksbaum, P. H.
- Hajdu, J.
- Meyer, D. A.
- Nicoul, M.
- Blome, C.
- Tschentscher, Th.
- Cavalieri, A. L.
- Falcone, R. W.
- Lee, S. H.
- Pahl, R.
- Rudati, J.
- Fuoss, P. H.
- Nelson, A. J.
- Krejcik, P.
- Siddons, D. P.
- Lorazo, P.
- Hastings, J. B.
Publication date
January 2008
DOI Publisher
American Physical Society (APS) ISSN
0031-9007Abstract
Femtosecond time-resolved small and wide angle x-ray diffuse scattering techniques are applied to investigate the ultrafast nucleation processes that occur during the ablation process in semiconducting materials. Following intense optical excitation, a transient liquid state of high compressibility characterized by large-amplitude density fluctuations is observed and the buildup of these fluctuations is measured in real time. Small-angle scattering measurements reveal snapshots of the spontaneous nucleation of nanoscale voids within a metastable liquid and support theoretical predictions of the ablation process
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