Add to ORKGA scanning tunnelling microscope (STM) mounted in a sample holder for a transmission electron microscope (TEM), a TEM-STM, have been used for in-situ electrical measurements of semiconductor nano whiskers. The device enables measurements and manipulations of nano structures while observing them in a TE
This dissertation describes the construction and performance of a dual-tip scanning tunneling micros...
This chapter is a review of an in situ method where a scanning electron microscope (SPM) has been co...
Abstract For in situ measurements of local electrical conductivity of well-defined crystal surfaces ...
Along with rapidly developing nanotechnology, new types of analytical instruments and techniques are...
Using manipulation holders specially designed for transmission electron microscope (TEM), nanostruct...
Electronic devices are strongly influenced by their microstructures. In situ transmission electron m...
We developed a new platform that enables in-situ four-probe electronic measurements, in-situ three-p...
The main goal of this thesis has been to apply in-situ Transmission Electron Microscopy (TEM) electr...
Applications in nanotechnology require the use of tools that can help visualize and manipulate struc...
Since its inception scanning tunneling microscopy (STM) has emerged as a powerful technique in the f...
In the present thesis the combination of real-time electricalmeasurements on nano-sampleswith simult...
Abstract. A scanning tunneling microscope (STM) com-bined with a transmission electron microscope (T...
We demonstrate the ability of a double-tip scanning tunneling microscope (STM) combined with a scann...
In situ electrical characterization of nanostructures inside a transmission electron microscope prov...
International audienceIn situ transmission electron microscopy (TEM) is a really rich topic and is s...
This dissertation describes the construction and performance of a dual-tip scanning tunneling micros...
This chapter is a review of an in situ method where a scanning electron microscope (SPM) has been co...
Abstract For in situ measurements of local electrical conductivity of well-defined crystal surfaces ...
Along with rapidly developing nanotechnology, new types of analytical instruments and techniques are...
Using manipulation holders specially designed for transmission electron microscope (TEM), nanostruct...
Electronic devices are strongly influenced by their microstructures. In situ transmission electron m...
We developed a new platform that enables in-situ four-probe electronic measurements, in-situ three-p...
The main goal of this thesis has been to apply in-situ Transmission Electron Microscopy (TEM) electr...
Applications in nanotechnology require the use of tools that can help visualize and manipulate struc...
Since its inception scanning tunneling microscopy (STM) has emerged as a powerful technique in the f...
In the present thesis the combination of real-time electricalmeasurements on nano-sampleswith simult...
Abstract. A scanning tunneling microscope (STM) com-bined with a transmission electron microscope (T...
We demonstrate the ability of a double-tip scanning tunneling microscope (STM) combined with a scann...
In situ electrical characterization of nanostructures inside a transmission electron microscope prov...
International audienceIn situ transmission electron microscopy (TEM) is a really rich topic and is s...
This dissertation describes the construction and performance of a dual-tip scanning tunneling micros...
This chapter is a review of an in situ method where a scanning electron microscope (SPM) has been co...
Abstract For in situ measurements of local electrical conductivity of well-defined crystal surfaces ...